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Study of carbon concentration on the nanostructuraland corrosion properties of Zr(C, N)/ss304 films

Published online by Cambridge University Press:  26 March 2010

M. M. Larijani ,
M. Alijannejad ,
M. Yari ,
M. B. Zanjanbar  and
M. Ghorannevis
M. M. Larijani*
Affiliation:
Agricultural, Medical and Industrial Research School, Nuclear Science & Technology Research Institute (NSTRI), P.O. Box 31585, -498, Karaj, Iran
M. Alijannejad
Affiliation:
Department of Physics, Karaj branch, Islamic Azad University, Karaj, Iran
M. Yari
Affiliation:
Corrosion Lab., Materials Eng. Dep., Islamic Azad University, Tehran, Iran
M. B. Zanjanbar
Affiliation:
Department of Physics, Karaj branch, Islamic Azad University, Karaj, Iran
M. Ghorannevis
Affiliation:
Plasma physics Research Centre, Islamic Azad University, P.O. Box 14665, -678, Tehran, Iran
*
[email protected]
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Abstract

The improvement of corrosion resistance of ZrN1-x Cx films (0 ≤ x ≤ 1) on AISI stainless steel (ss) 304 is studied as a function of methane flow rate introduced into mixture of argon and nitrogen gases (Ar + N2). The films were deposited using ion beam sputtering technique at 400 °C and their corrosion resistance has been investigated via electrochemical test using 0.5 M H2SO4 solution. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) were performed to study the micro and nano-structures of the films. Film stoichiometry was determined by Rutherford backscattering (RBS) technique using SIMNRA code. An average grain size of 7 nm was calculated for deposited films using Scherrer's formula. X-ray diffraction results showed the presence of a transition crystalline phase from ZrN to ZrC phase corresponding to the formation of ZrN1-x Cx crystalline phase. The electrochemical test revealed that the film corrosion resistance increased with increasing x values. Furthermore, micrographs obtained by SEM did not indicate any damage on the sample surface due to corrosive agent attacks for x > 0.6.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 50 , Issue 2 , May 2010 , 20501
Copyright
© EDP Sciences, 2010

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