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Structural and optical properties of thermally evaporated ZnS thin films

Published online by Cambridge University Press:  30 November 2010

R. Abou Samra ,
I. Asaad  and
M. Salim
R. Abou Samra
Affiliation:
Department of Physics, Damascus University, Damascus, Syria
I. Asaad*
Affiliation:
Higher Institute for Laser Research and Application (HILRA), Damascus University, Damascus, Syria
M. Salim
Affiliation:
Department of Physics, Damascus University, Damascus, Syria
*
[email protected]
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Abstract

In this work, we present experimental evidence and analytical studies of the XRD patterns and optical characterizations of ZnS films with different optical thicknesses. Thin films of ZnS were deposited on glass substrates by thermal evaporation. The crystallite size increased as the optical thicknesses. The overall absorbance has been increased with the film thickness and the direct band gap was obtained. It decreases with the increasing in the thickness of the films.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 52 , Issue 3 , December 2010 , 30301
Copyright
© EDP Sciences, 2010

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References

Cheng, J., Fan, D., Wang, H., Liu, B.W., Semicond. Sci. Technol. 18, 676 (2003) CrossRef
Bredol, M., Merikhi, J., J. Mater. Sci. 33, 471 (1998) CrossRef
L.I. Berger, Semiconductor Materials (CRC, New York, 1997)
Gangopadhyay, U., Kim, K., Mangalaraj, D., Yi, J., Appl. Surf. Sci. 230, 364 (2004) CrossRef
Porada, Z., Schabowska-Osiowska, E., Thin Solid Films 145, 75 (1986) CrossRef
Tomomura, Y., Kitagawa, M., Suzuki, A., Nakajima, S., J. Cryst. Growth 99, 451 (1990) CrossRef
Tonouchi, M., Sun, Y., Miyasato, T., Sakama, H., Ohmura, M., Jpn J. Appl. Phys. 2, 2453 (1990) CrossRef
Wu, X. et al., Appl. Surf. Sci. 254, 6455 (2008) CrossRef
Gordillo, G., Florez, J.M., Hernandez, L.C., Sol. Energy Mater. Sol. Cells 37, 273 (1995) CrossRef
M. Birkholz, Thin film analysis by X-ray scattering (Wiley-VCH, Weinberg, 2006)
Williamson, G.B., Smallman, R.C., Philos. Mag. 1, 34 (1956) CrossRef