Hostname: page-component-745bb68f8f-b95js Total loading time: 0 Render date: 2025-01-26T08:51:46.200Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural and optical characterization of oriented LiTaO3thin films deposited by sol-gel technique

Published online by Cambridge University Press:  24 June 2008

S. Youssef ,
R. Al Asmar ,
J. Podlecki ,
B. Sorli  and
A. Foucaran
S. Youssef*
Affiliation:
Institut d'Électronique du Sud IES – Université Montpellier II, UMR CNRS 5214, Place E. Bataillon, 34095 Montpellier, France
R. Al Asmar
Affiliation:
Département de Sciences et Technologie, Faculté des Sciences et de Génie Informatique, Université Saint-Esprit de Kaslik, BP 446 Jounieh, Liban
J. Podlecki
Affiliation:
Institut d'Électronique du Sud IES – Université Montpellier II, UMR CNRS 5214, Place E. Bataillon, 34095 Montpellier, France
B. Sorli
Affiliation:
Institut d'Électronique du Sud IES – Université Montpellier II, UMR CNRS 5214, Place E. Bataillon, 34095 Montpellier, France
A. Foucaran
Affiliation:
Institut d'Électronique du Sud IES – Université Montpellier II, UMR CNRS 5214, Place E. Bataillon, 34095 Montpellier, France
*
[email protected]
Get access

Abstract

This paper reports the characterization of lithium tantalite (LiTaO3) thin films deposited by sol gel process. Thin films were deposited on (001) sapphire substrates by spin coating. In order to study the effect of annealing temperature on the structural and optical properties, the films were annealed at several heating temperatures, ranging from 600 to 750 °C. From X-ray diffraction measurements it is confirmed that LiTaO3 films are highly c-axis oriented, the line width and the intensity of the (006) peak are sensitive to the variation of the annealing temperature and the best results were found at 700 °C. From SEM pictures it is found that the grain size increases from 100 to 200 nm when the annealing temperature is increased to 700 °C. From the optical transmittance and absorbance measurements, the band gap energy was extrapolated at about 4.6 eV which closely agrees with the LiTaO3 bulk value. Fourier transform infrared (FTIR) reflectivity and Raman backscattering were used as two complementary experiments to probe the zone center optical phonons in the lithium tantalite thin films.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 43 , Issue 1 , July 2008 , pp. 65 - 71
Copyright
© EDP Sciences, 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Kostritskii, S.M., Korkishko, Yu.N., Fedorov, V.A., J. Appl. Phys. 91, 930 (2002) CrossRef
A. Rauber, in Current Topics in Materials science, Vol. 1, edited by E. Kaldis (North-Holland, Amsterdam, 1978), pp. 481–601
Shibita, K., Yokoo, T., Shibita, K., Kuwano, Y., Jpn J. Appl. Phys. 26, 1898 (1987) CrossRef
Combette, P., Nougaret, L., Giani, A., Pascal-Delannoy, F., J. Cryst. Growth 304, 90 (2007) CrossRef
Combette, P., Nougaret, L., Sorli, B., Pascal-Delannoy, F., Ferroelectrics 353, 233 (2007) CrossRef
Guo, X.L., Liu, Z.G., Zhu, S.N., Yu, T., Xiong, S.B., Hu, W.S., J. Cryst. Growth 165, 187 (1997) CrossRef
Hung, L.S., Agostinelli, J.A., Mir, J.M., Appl. Phys. Lett. 62, 3071 (1993) CrossRef
Agostinelli, J.A., Braunstein, G.H., Blanton, T.N., Appl. Phys. Lett. 63, 123 (1993) CrossRef
Nashimoto, K., Mater. Res. Soc. Symp. Proc. 310, 293 (1993) CrossRef
Retuert, P.J., Kueuer, P.G., Wittke, O., Avila, R.E., Piderit, G.J., J. Mater. Res. 10, 2797 (1995) CrossRef
Xie, H., Raj, R., Appl. Phys. Lett. 63, 3146 (1993) CrossRef
Kao, M.C., Chen, Y.C., Wang, C.M., Chen, H.Z., Ferroelectrics 304, 147 (2004) CrossRef
Chen, C.J., Jeng, D.Y., Raychaudhuri, S., Uematsu, S., Hasegana, Y., Proc. SPIE 3136, 199 (1997) CrossRef
S.Y. Wu, IEEE Trans. Electron Devices ED-21, 499 (1974)
Hu, W.S., Liu, Z.G., Feng, D., Solid State Commun. 97, 481 (1996) CrossRef
C.J. Brinker, G.W. Scherer, Sol-Gel Science: The Physics and Chemistry of Sol-Gel Processing (Academic Press, San Diego, CA, 1990)
Araujo, E.B., Eiras, J.A., J. Eur. Ceram. Soc. 21, 1513 (2004) CrossRef
Kao, M.C., Lee, M.S., Wang, C.M., Chen, H.Z., Chen, Y.C., Jpn J. Appl. Phys. 41, 2982 (2002) CrossRef
Martinez, A.I., Acosta, D., Lopez, A., Superficies y Vacio 16, 5 (2003)
Inbar, I., Cohen, R.E., Phys. Rev. B 53, 1193 (1996) CrossRef
Liu, Y., Kitamura, K., Takekawa, S., Nakamura, M., Furukawa, Y., Hatano, H., Appl. Phys. Lett. 82, 4218 (2003) CrossRef
Schubert, M., Tiwald, T.E., Herzinger, C.M., Phys. Rev. B 61, 8187 (2000) CrossRef
A.F. Penna, A. Chaves, P.da R. Andrade, S.P.S. Porto, Phys. Rev. B 13, (1976)
Bersani, D., Lottici, P.P., Lopez, T., Ding, X., J. Sol-Gel Sc. Tech. 13, 849 (1998) CrossRef
Porto, S.P.S., Fleury, P.A., Damen, T.C., Phys. Rev. 154, 522 (1967) CrossRef
Shi, L., Kong, Y., Yan, W., Liu, H., Li, X., Xie, X., Zhao, D., Sun, L., Xu, J., Sun, J., Chen, S., Zhang, L., Huang, Z., Liu, S., Zhang, W., Zhang, G., Sol. State Commun. 135, 251 (2005) CrossRef
Kazan, M., Rufflé, B., Zgheib, Ch., Masri, P., Diam. Rel. Mat. 15, 1525 (2006) CrossRef