Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-04T22:37:23.224Z Has data issue: false hasContentIssue false
  • English
  • Français

Spectroscopic study of interfaces in Al/Ni periodic multilayers

Published online by Cambridge University Press:  31 January 2009

K. Le Guen ,
G. Gamblin ,
P. Jonnard ,
M. Salou ,
J. Ben Youssef ,
S. Rioual  and
B. Rouvellou
K. Le Guen*
Affiliation:
Laboratoire de Chimie-Physique - Matière et Rayonnement, UPMC Univ Paris 06, CNRS-UMR 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
G. Gamblin
Affiliation:
Laboratoire de Chimie-Physique - Matière et Rayonnement, UPMC Univ Paris 06, CNRS-UMR 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
P. Jonnard
Affiliation:
Laboratoire de Chimie-Physique - Matière et Rayonnement, UPMC Univ Paris 06, CNRS-UMR 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
M. Salou
Affiliation:
Laboratoire de Magnétisme de Bretagne, FRE/CNRS 2697, Université de Bretagne Occidentale, 6 avenue Le Gorgeu, CS 93837, 29238 Brest Cedex 3, France
J. Ben Youssef
Affiliation:
Laboratoire de Magnétisme de Bretagne, FRE/CNRS 2697, Université de Bretagne Occidentale, 6 avenue Le Gorgeu, CS 93837, 29238 Brest Cedex 3, France
S. Rioual
Affiliation:
Laboratoire de Magnétisme de Bretagne, FRE/CNRS 2697, Université de Bretagne Occidentale, 6 avenue Le Gorgeu, CS 93837, 29238 Brest Cedex 3, France
B. Rouvellou
Affiliation:
Laboratoire de Magnétisme de Bretagne, FRE/CNRS 2697, Université de Bretagne Occidentale, 6 avenue Le Gorgeu, CS 93837, 29238 Brest Cedex 3, France
*
[email protected]
Get access

Abstract

Using electron-induced X-ray emission spectroscopy (XES), we have studied two Al/Ni periodic multilayers that differ only by their annealing temperature: as-deposited and annealed at 115 °C. Our aim is to show that XES can provide further details about the chemistry at the metal-metal interface, in addition to what is obtained by X-ray diffraction. The distribution of valence states exhibiting Al 3p and Ni 3d character is determined from the analysis of the Al $K\beta$ and Ni $L\alpha$ emission bands respectively. The multilayer emission bands are compared to those of reference materials: pure Al and Ni metals as well as Al3Ni, Al3Ni2 and AlNi intermetallics. We provide evidence that, for temperatures up to 115 °C, Al3Ni is the major component of the multilayer.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 45 , Issue 2 , February 2009 , 20502
Copyright
© EDP Sciences, 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Vergand, F., Jonnard, P., Bonnelle, C., Europhys. Lett. 10, 67 (1998) CrossRef
Kefi, M., Jonnard, P., Vergand, F., Bonnelle, C., Gillet, E., J. Phys. Condens. Mat. 5, 8629 (1993) CrossRef
Jonnard, P., Capron, N., Semond, F., Massies, J., Martinez-Guerrero, E., Mariette, H., Eur. Phys. J. B 42, 351 (2004) CrossRef
Jonnard, P., J. Phys. IV (France) 8, 33 (1998) CrossRef
B. Predel, Phase Equilibria, Crystallographic and Thermodynamic Data of Binary Alloys, edited by O. Madelung (Springer, Berlin, 1991)
O'Connor, D.J., Draeger, M., Molenbroek, A.M., Shen, Y.G., Surf. Sci. 357, 202 (1996) CrossRef
Wehner, A., Jeliazova, Y., Franchy, R, Surf. Sci. 531, 287 (2003) CrossRef
Le Pévédic, S., Schmauss, D., Cohen, C., Surf. Sci. 600, 565 (2006) CrossRef
Hahn, P., Bertino, M.F., Toennies, J.P., Ritter, M., Weiss, W., Surf. Sci. 412, 82 (1998) CrossRef
Damoc, L., Fonda, E., Le Faure, P., Traverse, A., J. Appl. Phys. 92, 1862 (2002) CrossRef
Shutthanandan, V., Saleh, A.A., Smith, R.J., Science 450, 204 (2000)
Fonda, E., Petroff, F., Traverse, A., J. Appl. Phys. 93, 5937 (2003) CrossRef
Ruckman, M.W., Jiang, L., Stongin, M.J., J. Vac. Sci. Technol. A 8, 134 (1990) CrossRef
Hanamoto, K., Shinya, A., Kuwahara, M., Okamoto, T., Haraguchi, M., Fukui, M., Koto, K., Surf. Sci. 409, 413 (1998) CrossRef
Arranz, A., Palacio, C., Thin Solid Films 317, 55 (1998) CrossRef
Palacio, C., Arranz, A., J. Phys. Chem. B 104, 9647 (2000) CrossRef
Buchanan, J.D.R., Hase, T.P.A., Tanner, B.K., Chen, P.J., Gan, L., Powell, C.J., Egelhoff, W.F., J. Appl. Phys. 93, 8044 (2003) CrossRef
Michaelsen, C., Lucadamo, G., Barmak, K., J. Appl. Phys. 80, 6689 (1996) CrossRef
Zalar, A., Hofmann, S., Kohl, D., Panjan, P., Thin Solid Films 270, 341 (1995) CrossRef
Rothhaar, U., Oechsner, H., Scheib, M., Müller, R., Phys. Rev. B 61, 974 (2000) CrossRef
Zalar, A., Jagielski, J., Mozetic, M., Pracek, B., Panjan, P., Vacuum 61, 291 (2001) CrossRef
Colgan, E.G., Mayer, J.W., Nucl. Instrum. Meth. Phys. Res. B 17, 242 (1986) CrossRef
Salou, M., Rioual, S., Ben Youssef, J., Dekadjevi, D., Pogossian, S., Rouvellou, B., Jonnard, P., Le Guen, K., Gamblin, G., Lépine, B., Surf. Interf. Anal. 40, 1318 (2008) CrossRef
Jarrige, I., Jonnard, P., Frantz-Rodriguez, N., Danaie, K., Bossebœuf, A., Surf. Interf. Anal. 34, 694 (2002) CrossRef
Jonnard, P., Jarrige, I., Benbalagh, R., Maury, H., André, J.-M., Dankhazi, Z., Rolland, G., Surf. Sci. 589, 164 (2005) CrossRef
Maury, H., Jonnard, P., André, J.-M., Gautier, J., Roulliay, M., Bridou, F., Delmotte, F., Ravet, M.-F., Jérome, A., Holliger, P., Thin Solid Films 514, 278 (2006) CrossRef
Bonnelle, C., Vergand, F., Jonnard, P., André, J.-M., Avila, P., Chargelègue, P., Fontaine, M.-F., Laporte, D., Paquier, P., Ringuenet, A., Rodriguez, B., Rev. Sci. Instrum. 65, 3466 (1994) CrossRef
L.V. Azaroff, X-ray Spectroscopy (McGraw-Hill Inc., 1974)
Bonnelle, C., Annu. Rep. Prog. Chem., Sect. C: Phys. Chem. 84, 201 (1987)
Hovington, P., Drouin, D., Gauvin, R., Scanning 19, 1 (1997)