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Solar blind AlGaN photodetectors with a very high spectral selectivity

Published online by Cambridge University Press:  18 January 2006

J.-Y. Duboz*
Affiliation:
CRHEA, CNRS, rue Bernard Gregory, Sophia Antipolis, 06560 Valbonne, France
N. Grandjean
Affiliation:
CRHEA, CNRS, rue Bernard Gregory, Sophia Antipolis, 06560 Valbonne, France
A. Dussaigne
Affiliation:
CRHEA, CNRS, rue Bernard Gregory, Sophia Antipolis, 06560 Valbonne, France
M. Mosca
Affiliation:
THALES Research and Technology, Domaine de Corbeville, 91404 Orsay Cedex, France
J.-L. Reverchon
Affiliation:
THALES Research and Technology, Domaine de Corbeville, 91404 Orsay Cedex, France
P. G. Verly
Affiliation:
Institute for Microstructural sciences, National Research Council, Ottawa K1A 0R6, Ontario, Canada
R. H. Simpson
Affiliation:
Institute for Microstructural sciences, National Research Council, Ottawa K1A 0R6, Ontario, Canada
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Abstract

Solar blind detectors based on AlGaN heterostructures grown on sapphire by Molecular Beam Epitaxy and with a dielectric interference filter deposited on the back side are demonstrated to provide record spectral selectivity. Rejection ratios of 2 × 104, and better than 5 × 104, measured between 280 and 320 nm, are achieved in Metal Semiconductor Metal detectors and Schottky diodes respectively. The whole detector process is fully compatible with low cost array fabrication.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2006

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References

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