Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

K. Suenaga; Y. Iizumi; T. Okazaki

doi:10.1051/epjap/2011100414

Abstract

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Imaging and chemical analysis of individual metallofullerene molecules were successfully carried out without massive destruction using a scanning transmission electron microscope (STEM) operated at 30 kV. Electron energy-loss spectroscopy (EELS) unambiguously identified the constituent atom of each metallofullerene molecule. The profile of EELS chemical map measured across the single atom provides a rough estimate of EELS signal delocalization, which is considerably reduced using accelerating voltage as low as 30 kV.

References

Suenaga, K. et al., Science 290, 2280 (2000)CrossRef

Hirahara, K. et al., Phys. Rev. Lett. 85, 5384 (2000)CrossRef

Tencé, M., Quartuccio, M., Colliex, C. Ultramicroscopy 58, 42 (1995)CrossRef

Sawada, H. et al., J. Electron Microsc. 58, 341 (2009)CrossRef

Sawada, H. et al., Ultramicroscopy 110, 958 (2010)CrossRef

Sasaki, T. et al., J. Electron Microsc. 59, S7 (2010)CrossRef

Suenaga, K. et al., Nat. Chem. 1, 415 (2010)CrossRef

Krivanek, O. et al., Ultramicroscopy 110, 935 (2010)CrossRef

Banhart, F. Rep. Prog. Phys. 62, 1181 (1999)CrossRef

Gubbens, A. et al., Ultramicroscopy 110, 962 (2010)CrossRef

Howie, A., in Presentations at Past, Present and Future of (S)TEM and its Application, Paris, France 2010Google Scholar

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Suenaga, Kazu Kobayashi, Haruka and Koshino, Masanori 2012. Single atom imaging and spectroscopy in nanostructured carbon materials. MRS Bulletin, Vol. 37, Issue. 1, p. 36.

Suenaga, K. Akiyama-Hasegawa, K. Niimi, Y. Kobayashi, H. Nakamura, M. Liu, Z. Sato, Y. Koshino, M. and Iijima, S. 2012. Atomic imaging and spectroscopy of low-dimensional materials with interrupted periodicities. Journal of Electron Microscopy, Vol. 61, Issue. 5, p. 285.

Suenaga, Kazu Kobayashi, Haruka and Koshino, Masanori 2012. Core-Level Spectroscopy of Point Defects in Single Layerh-BN. Physical Review Letters, Vol. 108, Issue. 7,

Krivanek, Ondrej L. Zhou, Wu Chisholm, Matthew F. Idrobo, Juan Carlos Lovejoy, Tracy C. Ramasse, Quentin M. and Dellby, Niklas 2012. Low Voltage Electron Microscopy. p. 119.

Colliex, C. Gloter, A. March, K. Mory, C. Stéphan, O. Suenaga, K. and Tencé, M. 2012. Capturing the signature of single atoms with the tiny probe of a STEM. Ultramicroscopy, Vol. 123, Issue. , p. 80.

Holmberg, Vincent C. Helps, Justin R. Mkhoyan, K. Andre and Norris, David J. 2013. Imaging Impurities in Semiconductor Nanostructures. Chemistry of Materials, Vol. 25, Issue. 8, p. 1332.

Suenaga, Kazu 2014. Elemental analysis down to the single atom with electron beams . Comptes Rendus. Physique, Vol. 15, Issue. 2-3, p. 151.

Sawada, Hidetaka Sasaki, Takeo Hosokawa, Fumio and Suenaga, Kazutomo 2014. Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM. Micron, Vol. 63, Issue. , p. 35.

Sasaki, Takeo Sawada, Hidetaka Hosokawa, Fumio Sato, Yuta and Suenaga, Kazu 2014. Aberration-corrected STEM/TEM imaging at 15 kV. Ultramicroscopy, Vol. 145, Issue. , p. 50.

Tizei, Luiz H. G. Liu, Zheng Koshino, Masanori Iizumi, Yoko Okazaki, Toshiya and Suenaga, Kazu 2014. Single Molecular Spectroscopy: Identification of Individual Fullerene Molecules. Physical Review Letters, Vol. 113, Issue. 18,

Sawada, H. Sasaki, T. Hosokawa, F. and Suenaga, K. 2015. Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle. Physical Review Letters, Vol. 114, Issue. 16,

Senga, Ryosuke and Suenaga, Kazu 2015. Single-atom electron energy loss spectroscopy of light elements. Nature Communications, Vol. 6, Issue. 1,

Chamberlain, Thomas W. Biskupek, Johannes Skowron, Stephen T. Bayliss, Peter A. Bichoutskaia, Elena Kaiser, Ute and Khlobystov, Andrei N. 2015. Isotope Substitution Extends the Lifetime of Organic Molecules in Transmission Electron Microscopy. Small, Vol. 11, Issue. 5, p. 622.

Tizei, Luiz H. G. Nakanishi, Ryo Kitaura, Ryo Shinohara, Hisanori and Suenaga, Kazu 2015. Core-Level Spectroscopy to Probe the Oxidation State of Single Europium Atoms. Physical Review Letters, Vol. 114, Issue. 19,

Westenfelder, Benedikt Biskupek, Johannes Meyer, Jannik C. Kurasch, Simon Lin, Xiaohang Scholz, Ferdinand Gross, Axel and Kaiser, Ute 2015. Bottom-up formation of robust gold carbide. Scientific Reports, Vol. 5, Issue. 1,

Su, Dang Sheng Zhang, Bingsen and Schlögl, Robert 2015. Electron Microscopy of Solid Catalysts—Transforming from a Challenge to a Toolbox. Chemical Reviews, Vol. 115, Issue. 8, p. 2818.

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Tizei, Luiz H.G. Iizumi, Yoko Okazaki, Toshiya Nakanishi, Ryo Kitaura, Ryo Shinohara, Hisanori and Suenaga, Kazu 2016. Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yield. Ultramicroscopy, Vol. 160, Issue. , p. 239.

Linck, Martin Hartel, Peter Uhlemann, Stephan Kahl, Frank Müller, Heiko Zach, Joachim Haider, Max. Niestadt, Marcel Bischoff, Maarten Biskupek, Johannes Lee, Zhongbo Lehnert, Tibor Börrnert, Felix Rose, Harald and Kaiser, Ute 2016. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters, Vol. 117, Issue. 7,

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Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

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