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Self-regulated charge transfer and band tilt in nm-scale polar GaN films

Published online by Cambridge University Press:  28 October 2006

M.-H. Tsai*
Affiliation:
Department of Physics, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan
S. K. Dey
Affiliation:
Department of Chemical and Materials Engineering, and Electrical Engineering, Ira A. Fulton College of Engineering, Arizona State University, Tempe, AZ 85287-6006, USA
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Abstract

Using first-principles calculation for the electronic structures of nm-scale [0001] GaN freestanding films, it is found that the Ga-terminated surface (S Ga) has a positive electrostatic potential, while the N-terminatedsurface has a negative electrostatic potential (S N), so that the energy bands tilt upwards from S Ga to S N. Additionally, it is determined that an intrinsic self-regulated charge transfer across the film limits the electrostatic potential difference across the film, which renders the local conduction band energy minimum at S Ga approximately equal to the local valence band energy maximum at S N. This effect is found to occur in films thicker than ~4 nm. If the dangling-bond/surface states at both S Ga and S N are passivated by pseudo-hydrogen atoms, the tilt of energy bands is similar, though the cross-film potential is reduced due to the extra H5/4-Ga and N-H3/4 dipole layers.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2006

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References

Jia, L., Yu, E.T., Keogh, D., Asbeck, P.M., Miraglia, P., Roskowski, A., Davis, R.F., Appl. Phys. Lett. 79, 2916 (2001) CrossRef
Ambacher, O., Dimitrov, R., Stutzmann, M., Foutz, B.E., Murphy, M.J., Smart, J.A., Shealy, J.R., Weimann, N.G., Chu, K., Chumbes, M., Green, B., Sierakowski, A.J., Schaff, W.J., Eastman, L.F., Phys. Status Solidi B 216, 381 (1999) 3.0.CO;2-O>CrossRef
Gfrörer, O., Gemmer, C., Off, J., Im, J.S., Scholz, F., Hangleiter, A., Phys. Status Solidi B 216, 405 (1999) 3.0.CO;2-#>CrossRef
Sala, F.D., Di Carlo, A., Ligli, P., Bernardini, F., Fiorentini, V., Scholz, R., Jancu, J.-M., Appl. Phys. Lett. 74, 2002 (1999) CrossRef
Traetta, G., Di Carlo, A., Reale, A., Lugli, P., Lomascolo, M., Passaseo, A., Cingolani, R., Bonfiglio, A., Berti, M., Napolitani, E., Natali, M., Sinha, S.K., Drigo, A.V., J. Cryst. Growth 230, 492 (2001) CrossRef
Sierakowski, A.J., Eastman, L.F., J. Appl. Phys. 86, 3398 (1999) CrossRef
Ambacher, O., Majewski, J., Miskys, C., Link, A., Hermann, M., Eickhoff, M., Stutzmann, M., Bernardini, F., Fiorentini, V., Tilak, V., Schaff, B., Eastman, L.F., J. Phys.-Cond. 14, 3399 (2002)
Grandjean, N., Massies, J., Leroux, M., Appl. Phys. Lett. 74, 2361 (1999) CrossRef
Stutzmann, M., Ambacher, O., Eickhoff, M., Karrer, U., Lima Pimenta, A., Neuberger, R., Schalwig, J., Dimitrov, R., Schuck, P.J., Grober, R.D., Phys. Status Solidi B 228, 505 (2001) 3.0.CO;2-U>CrossRef
Chichibu, S.F., Abare, A.C., Minsky, M.S., Keller, S., Fleischer, S.B., Bowers, J.E., Hu, E., Mishra, U.K., Coldren, L.A., DenBaars, S.P., Sota, T., Appl. Phys. Lett. 73, 2006 (1998) CrossRef
Karrer, U., Ambacher, O., Stutzmann, M., Appl. Phys. Lett. 77, 2012 (2000) CrossRef
Hellman, E.S., MRS Internet J. Nitride Semicond. Res. 3, 11 (1998) CrossRef
Sumiya, M., Fuke, S., MRS Internet J. Nitride Semicond. Res. 9, 1 (2004) CrossRef
Ambacher, O., Smart, J., Shealy, J.R., Weimann, N.G., Chu, K., Murphy, M., Schaff, W.J., Eastman, L.F., Dimitrov, R., Wittmer, L., Stutzmann, M., Rieger, W., Hilsenbeck, J., J. Appl. Phys. 85, 3222 (1999) CrossRef
Bernardini, F., Fiorentini, V., Vanderbilt, D., Phys. Rev. B 56, R10024 (1997) CrossRef
Bernardini, F., Fiorentini, V., Phys. Status Solidi B 216, 391 (1999) 3.0.CO;2-K>CrossRef
Bernardini, F., Fiorentini, V, Appl. Phys. Lett. 80, 4145 (2002) CrossRef
Fiorentini, V., Bernardini, F., Sala, F.D., Di Carlo, A., Lugli, P., Phys. Rev. B 60, 8849 (1999) CrossRef
Bernardini, F., Fiorentini, V., Phys. Rev. B 57, R9427 (1998) CrossRef
Bernardini, F., Fiorentini, V., Phys. Rev. B 58, 15292 (1998) CrossRef
Bernardini, F., Fiorentini, V., Phys. Rev. B 64, 085207 (2001) CrossRef
Zoroddu, A., Bernardini, F., Ruggerone, F.P., Fiorentini, V., Phys. Rev. B 64, 45208 (2001) CrossRef
Ambacher, O., Eickhoff, M., Link, A., Hermann, M., Stuzmann, M., Bernardini, F., Fiorentini, V., Smorchkova, Y., Speck, J., Mishra, U., Schaff, W., Tilak, V., Eastman, L.F., Phys. Status Solidi C 0, 1878 (2003) CrossRef
Ambacher, O., J. Phys. D Appl. Phys. 31, 2653 (1998) CrossRef
Fiorentini, V., Bernardini, F., Ambacher, O., Appl. Phys. Lett. 80, 1204 (2002) CrossRef
Leroux, M., Grandjean, N., Langt, M., Massies, J., Gil, B., Lefebvre, P., Bigenwal, P., Phys. Rev. B 58, R13371 (1998) CrossRef
Cingolani, R., Botchkarev, A., Tang, H., Morhoc, H., Traetta, G., Coli, G., Lomascolo, M., Phys. Rev. B 61, 2711 (2000) CrossRef
Simon, J., Pelekanos, N.T., Adelmann, C., Martinez-Guerrero, E., André, R., Daudin, B., Dang, Le Si, Mariette, H., Phys. Rev. B 68, 035312 (2003) CrossRef
Bechstedt, F., Grossner, U., Furthmueller, J., Phys. Rev. B 62, 8003 (2000) CrossRef
King-Smith, R.D., Vanderbilt, D., Phys. Rev. B 47, 1651 (1993) CrossRef
Bengtson, L., Phys. Rev. B 59, 12301 (1999) CrossRef
Kasowski, R.V., Tsai, M.-H., Rhodin, T.N., Chambliss, D.D., Phys. Rev. B 34, 2656 (1986) CrossRef
In the modified PSF method, the projections of the tailing functions of the muffin-tin orbitals of surrounding atoms onto a given atom are calculated using two-dimensional structure factors of Kambe [K. Kambe, Z. Naturf., 22a, 322 (1967a); 22a, 422 (1967b); 23a, 1280 (1968)] rather than the partial waves of plane-wave expanded pseudofunctions in the original method32
Hedin, L., Lundqvist, B.I., J. Phys. C 4, 2064 (1971) CrossRef
Andersen, O.K., Phys. Rev. B 12, 3060 (1976) CrossRef
Cunningham, S.L., Phys. Rev. B 10, 4988 (1974) CrossRef
Tsai, M.-H., Sankey, O.F., Schmidt, K.E., Tsong, I.S.T., Mat. Sci. Eng. B 88, 40 (2002) CrossRef
Brandt, O., Yang, H., Jenichen, B., Suzuki, Y., Däweritz, L., Ploog, K.H., Phys. Rev. B 52, R2253 (1995) CrossRef
Shiraishi, K., J. Phys. Soc. Jpn 59, 3455 (1990) CrossRef
Görling, A., Phys. Rev. B 53, 7024 (1996) CrossRef
Deguchi, T., Ichiryu, D., Toshikawa, K., Sekiguchi, K., Sota, T., Matsuo, R., Azuhata, T., Yamaguchi, M., Yagi, T., Chichibu, S., Nakamura, S., J. Appl. Phys. 86, 1860 (1999) CrossRef
Mehta, R.R., Silverman, B.D., Jacobs, J.T., J. Appl. Phys. 44, 3379 (1973) CrossRef