Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-26T04:25:18.589Z Has data issue: false hasContentIssue false

Resonant photoemission of rare earth doped GaN thin films

Published online by Cambridge University Press:  28 September 2011

S.R. McHale*
Affiliation:
Air Force Institute of Technology, 2950 Hobson Way, Wright Patterson Air Force Base, OH 45433, USA
J.W. McClory*
Affiliation:
Air Force Institute of Technology, 2950 Hobson Way, Wright Patterson Air Force Base, OH 45433, USA
J.C. Petrosky
Affiliation:
Air Force Institute of Technology, 2950 Hobson Way, Wright Patterson Air Force Base, OH 45433, USA
J. Wu
Affiliation:
Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, PR 00931, USA
R. Palai
Affiliation:
Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, PR 00931, USA
Ya.B. Losovyj
Affiliation:
The J. Bennett Johnston Sr. Center for Advanced Microstructures and Devices, Louisiana State University, 6890 Jefferson Highway, Baton Rouge, LA 70806, USA
P.A. Dowben
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, Theodore Jorgensen Hall, 855 North 16th Street, University of Nebraska, P.O. Box 880299, Lincoln, NE 68588-0299, USA
Get access

Abstract

The 4d → 4f Fano resonances for various rare earth doped GaN thin films (RE = Gd, Er, Yb) were investigated using synchrotron photoemission spectroscopy. The resonant photoemission Fano profiles show that the major Gd and Er rare earth 4f weight is at about 5–6 eV below the valence band maximum, similar to the 4f weights in the valence band of many other rare earth doped semiconductors. For Yb, there is very little resonant enhancement of the valence band of Yb doped GaN, consistent with a largely 4f14 occupancy.

Type
Research Article
Copyright
© EDP Sciences, 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Koubaa, T., Dammak, M., Kammoun, M., Jadwisienczak, W.M., Lozykowski, H.J., J. Alloys Compd. 496, 56 (2010)CrossRef
Koubaa, T., Dammak, M., Kammoun, M., Jadwisienczak, W.M., Lozykowski, H.J., Anders, A., J. Appl. Phys. 106, 013106 (2009)CrossRef
Jadwisienczak, W.M., Lozykowski, H.J., Opt. Mater. 23, 175 (2003)CrossRef
Kenyon, A.J., Prog. Quant. Electr. 26, 225 (2002)CrossRef
Park, J.H., Steckl, A.J., Phys. Stat. Sol. (a) 205, 26 (2008)CrossRef
Nishikawa, A., Kawasaki, T., Furukawa, N., Terai, Y., Fujiwara, Y., Appl. Phys. Exp. 2, 1004 (2009)
Steckl, A.J., Heikenfeld, J., Lee, D.S., Garter, M., Mater. Sci. Eng. B 81, 97 (2001)CrossRef
Tao, J.H., Perea-Lopez, N., McKittrick, J., Talbot, J.B., Klinedinst, K., Raukas, M., Laski, J., Mishra, K.C., Hirata, G., Phys. Stat. Sol. (c) 5, 1889 (2008)CrossRef
Shi, J., Chandrashekhar, M.V.S., Reiherzer, J., Schaff, W., Lu, J., Disalvo, F., Spencer, M., Phys. Stat. Sol. (c) 5, 1495 (2008)CrossRef
Jadwisienczak, W., Wisniewski, K., Spencer, M., Thomas, T., Ingram, D., Radiat. Meas. 45, 500 (2010)CrossRef
Okada, H., Nakanishi, Y., Wakahara, A., Yoshida, A., Ohshima, T., Nucl. Instr. Methods B 266, 853 (2008)CrossRef
Nakanishi, Y., Wakahara, A., Okada, H., Yoshida, A., Ohshima, T., Itoh, H., Appl. Phys. Lett. 81, 1943 (2002)CrossRef
Thomas, T., Guo, X., Chandrashekhar, M.V.S., Poitras, C.B., Shaff, W., Dreibelbis, M., Reiherzer, J., Li, K., DiSalvo, F.J., Lipson, M., J. Cryst. Growth 311, 4402 (2009)CrossRef
Steckl, A.J., Park, J.H., Zavada, J.M., Mater. Today 10, 20 (2007)CrossRef
Wang, Y.Q., Steckl, A.J., Appl. Phys. Lett. 82, 502 (2003)CrossRef
Dieke, G.H., Crosswhite, H.M., Appl. Opt. 2, 675 (1963)CrossRef
Hüfner, S., Gschneidner, K.A., Eyring, L.R., Handbook on the Physics and Chemistry of Rare Earths (North Holland, Amsterdam, 1978)Google Scholar
McHale, S.R., McClory, J.W., Petrosky, J.C., Wu, J., Rivera, A., Palai, R., Losovyj, Y.B., Dowben, P.A., Eur. Phys. J. Appl. Phys. 53, 3 (2011)
Plucinski, L., Learmonth, T., Colakerol, L., Bernardis, S., Zhang, Y., Glans, P.A., Smith, K.E., Zakharov, A.A., Nyholm, R., Grzegory, I., Solid State Commun. 136, 191 (2005)CrossRef
Chiang, T.C., Eastman, D.E., Phys. Rev. B 21, 5749 (1980)CrossRef
Suzuki, S., Kiyokura, T., Maeda, F., Nath, K.G., Watanabe, Y., Saitoh, T., Kakizaki, A., J. Electron Spectros. Relat. Phenomena 114, 421 (2001)CrossRef
Maruyama, T., Morishima, S., Bang, H., Akimoto, K., Nanishi, Y., J. Cryst. Growth 237, 1167 (2002)CrossRef
Ketsman, I., Losovyj, Y.B., Sokolov, A., Tang, J., Wang, Z., Belashchenko, K.D., Dowben, P.A., Appl. Phys. A: Mater. Sci. Process. 89, 489 (2007)CrossRef
Sabirianov, R.F., Mei, W.N., Lu, J., Gao, Y., Zeng, X.C., Bolskar, R.D., Jeppson, P., Wu, N., Caruso, A.N., Dowben, P.A., J. Phys.: Condens. Matter 19, 082201 (2007)
Ketsman, I., Losovyj, Y.B., Sokolov, A., Tang, J., Wang, Z., Natta, M.L., Brand, J.I., Dowben, P.A., Appl. Surf. Sci. 254, 4308 (2008)CrossRef
McHale, S.R., McClory, J.W., Petrosky, J.C., Wu, J., Palai, R., Dowben, P.A., Ketsman, I., Mater. Lett. 65, 1476 (2011)CrossRef
Duan, C.G., Sabirianov, R.F., Mei, W.N., Dowben, P.A., Jaswal, S.S., Tsymbal, E.Y., J. Phys.: Condens. Matter 19, 315220 (2007)
Asahi, H., Zhou, Y.K., Hashimoto, M., Kim, M.S., Li, X.J., Emura, S., Hasegawa, S., J. Phys.: Condens. Matter 16, S5555 (2004)
Takahashi, M., Zhou, Y.K., Nakamura, T., Emura, S., Hasegawa, S., Asahi, H., J. Supercond. Nov. Magn. 23, 107 (2010)CrossRef
Dhar, S., Brandt, O., Ramsteiner, M., Sapega, V.F., Ploog, K.H., Phys. Rev. Lett. 94, 37205 (2005)CrossRef
Pérez, L., Lau, G.S., Dhar, S., Brandt, O., Ploog, K.H., Phys. Rev. B 74, 195207(2006)CrossRef
Hejtmánek, J., Knížek, K., Maryško, M., Jirák, Z., Sedmidubský, D., Sofer, Z., Peřina, V., Hardtdegen, H., Buchal, C., J. Appl. Phys. 103, 07D107 (2008)CrossRef
Han, S.Y., Hite, J., Thaler, G.T., Frazier, R.M., Abernathy, C.R., Pearton, S.J., Choi, H.K., Lee, W.O., Park, Y.D., Zavada, J.M., Appl. Phys. Lett. 88, 042102 (2006)CrossRef
Teraguchi, N., Suzuki, A., Nanishi, Y., Zhou, Y.K., Hashimoto, M., Asahi, H., Solid State Commun. 122, 651 (2002)CrossRef
Filhol, J.S., Jones, R., Shaw, M.J., Briddon, P.R., Appl. Phys. Lett. 84, 2841 (2004)CrossRef
Hourahine, B., Sanna, S., Aradi, B., Köhler, C., Frauenheim, T., Phys. B: Condens. Matter 376, 512 (2006)CrossRef
Losovyj, Y., Ketsman, I., Morikawa, E., Wang, Z., Tang, J., Dowben, P., Nucl. Instrum. Methods A 582, 264 (2007)CrossRef
Hormes, J., Scott, J.D., Suller, V.P., Synchrotron Radiat. News 19, 27 (2006)CrossRef
Roy, A., Morikawa, E., Bellamy, H., Kumar, C., Goettert, J., Suller, V., Morris, K., Ederer, D., Scott, J., Nucl. Instrum. Methods A 582, 22 (2007)CrossRef
Morikawa, E., Scott, J.D., Goettert, J., Aigeldinger, G., Kumar, C.S.S.R., Craft, B.C., Sprunger, P.T., Tittsworth, R.C., Hormes, F.J., Rev. Sci. Instrum. 73, 1680 (2002)CrossRef
Dowben, P.A., LaGraffe, D., Onellion, M., J. Phys.: Condens. Matter 1, 6571 (1989)
Wendin, G., Breakdown of the One-Electron Pictures in Photoelectron Spectra, Structure and Bonding, vol. 45 (Springer-Verlag, Berlin, 1981)Google Scholar
Fano, U., Phys. Rev. 124, 1866 (1961)CrossRef
Losovyj, Y.B., Wooten, D., Santana, J.C., An, J.M., Belashchenko, K.D., Lozova, N., Petrosky, J., Sokolov, A., Tang, J., Wang, W., J. Phys.: Condens. Matter 21, 045602 (2009)
Sugar, J., Phys. Rev. B 5, 1785 (1972)CrossRef
Zimkina, T.M., Fomichev, V.A., Gribovskii, S.A., Zhukova, I.I., Sov. Phys. Solid State 9, 1447 (1967)
Leuenberger, F., Parge, A., Felsch, W., Fauth, K., Hessler, M., Phys. Rev. B 72, 014427 (2005)CrossRef
Komesu, T., Jeong, H.K., Choi, J., Borca, C.N., Dowben, P.A., Petukhov, A.G., Schultz, B.D., Palmstrm, C.J., Phys. Rev. B 67, 035104 (2003)CrossRef
Lang, J.K., Baer, Y., Cox, P.A., J. Phys. F: Metal Phys. 11, 121 (1981)CrossRef
Stauffer, L., Pirri, C., Wetzel, P., Mharchi, A., Paki, P., Bolmont, D., Gewinner, G., Minot, C., Phys. Rev. B 46, 13201 (1992)CrossRef
Svane, A., Christensen, N.E., Petit, L., Szotek, Z., Temmerman, W.M., Phys. Rev. B 74, 165204 (2006)CrossRef
Yakovkin, I.N., Komesu, T., Dowben, P.A., Phys. Rev. B 66, 035406 (2002)CrossRef
Strange, P., Svane, A., Temmerman, W.M., Szotek, Z., Winter, H., Nature 399, 756 (1999)CrossRef
Dalpian, G.M., Wei, S.H., Phys. Rev. B 72, 115201 (2005)CrossRef
Dowben, P.A., Surf. Sci. Rep. 40, 151 (2000)CrossRef
Johansson, L.I., Allen, J.W., Lindau, I., Hecht, M.H., Hagström, S.B.M., Phys. Rev. B 21, 1408 (1980)CrossRef
Schmidt-May, J., Gerken, F., Nyholm, R., Davis, L.C., Phys. Rev. B 30, 5560 (1984)CrossRef
Sun, Y.M., Wu, M.C., J. Appl. Phys. 78, 6691 (1995)CrossRef