Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-06T07:02:46.571Z Has data issue: false hasContentIssue false

Polarimetric studies of polyethylene terephtalate flexible substrates

Published online by Cambridge University Press:  06 December 2008

M. Stchakovsky*
Affiliation:
Horiba Jobin Yvon SAS, 5 avenue Arago, 91380 Chilly-Mazarin, France
E. Garcia-Caurel
Affiliation:
LPICM, École Polytechnique, CNRS, 91128 Palaiseau, France
M. Warenghem
Affiliation:
UCCS-Artois, UMR CNRS 8181, Université d'Artois, 62307 Lens, France
Get access

Abstract

Polymer sheets are currently used worldwide in a wide range of applications. The manufacturing process of these sheets involves extruding machines that stretch the material in both lateral and longitudinal directions with respect to the machine direction, thus inducing birefringence. In most cases, the film obtained is optically biaxial. Polarimetric spectroscopy (Ellipsometry and Mueller Matrix) combined with conoscopic observation are the methods of choice to study these properties. In this work we report an analysis of commercially available polyethylene terephtalate (PET) films used as substrate for food packaging as well as for embedded electronic devices such as solar cells or flexible displays. Initial observation of these films through polarizing microscope in conoscopic mode reveals first the trace of optical axis plane with respect to the film surface and second, whether the optical axis is acute or not. This preliminary study allows optimal sample positioning for further polarimetric studies. The measurements and modelling are done in both reflection and transmission mode on several spectroscopic polarimetric setups from UV to NIR. The models give as a main result, the dielectric tensor of the film as well as its orientation with respect to the laboratory reference frame.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Lapersonne, P., Tassin, J.F., Monnerie, L., Polymer 35, 2192 (1994) CrossRef
Darvis, D.A., Hutchinson, I.J., Bower, D.I., Ward, I.M., Polymer 21, 41 (1980)
F. Balta-Calleja, A. Vonk, X-ray Scattering of Synthetic Polymers (Elsevier, Amsterdam, 1989)
Clayden, N.J., Eaves, J.G., Croot, L., Polymer 38, 159 (1997) CrossRef
Forcht, K., Gombert, A., Joerger, R., Köhl, M., Thin Solid Films 302, 43 (1997) CrossRef
Elman, J.F., Greener, J., Herzinger, C.M., Johs, B., Thin Solid Films 313-314, 814 (1998) CrossRef
Stchakovsky, M., Callaud, C., Foldina, M., Ossikovski, R., Garcia-Caurel, E., Thin Solid Films 516, 1414 (2008) CrossRef
Drévillon, B., Prog. Cryst. Growth Charact. Mater. 27, 1 (1993) CrossRef