Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-08T11:26:29.886Z Has data issue: false hasContentIssue false

Optical and electrical anisotropy of ordered layers of rigid core semiconductor – dithienothiophene derivative

Published online by Cambridge University Press:  02 September 2010

T. Marszalek*
Affiliation:
Department of Molecular Physics, Technical University of Lodz, Zeromskiego 116, 90-924 Lodz, Poland
E. Dobruchowska
Affiliation:
Department of Molecular Physics, Technical University of Lodz, Zeromskiego 116, 90-924 Lodz, Poland
J. Jung
Affiliation:
Department of Molecular Physics, Technical University of Lodz, Zeromskiego 116, 90-924 Lodz, Poland
J. Ulanski
Affiliation:
Department of Molecular Physics, Technical University of Lodz, Zeromskiego 116, 90-924 Lodz, Poland
M. Melucci
Affiliation:
Consiglio Nazionale Ricerche, CNR-ISOF, Via P. Gobetti 101, 40129 Bologna, Italy
G. Barbarella
Affiliation:
Consiglio Nazionale Ricerche, CNR-ISOF, Via P. Gobetti 101, 40129 Bologna, Italy
Get access

Abstract

Preparation of highly oriented layers of organic semiconductor – dithienothiophene derivative is described. The layers were obtained by zone-casting technique – a solution based one step method that does not require the use of preoriented substrates. Unidirectional alignment of the dithienothiophene derivative molecules in the zone-cast layers was confirmed by absorption and photoluminescence polarized spectra. Anisotropy of electrical properties was characterised by means of anisotropy of charge carrier mobility in field effect transistors (FETs). The FET devices were fabricated in bottom contacts – bottom gate configuration with the channel lengths parallel and perpendicular to the crystal growth direction, respectively. The FET mobility determined in the direction parallel to the zone-casting direction is ca. 1 order of magnitude higher than those in the perpendicular direction.

Type
Research Article
Copyright
© EDP Sciences, 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Dimitrakopoulos, C.D., Mascaro, D.J., IBM J. Res. Dev. 45, 11 (2001) CrossRef
Nishimura, H., Iizuka, M., Kuniyoshi, S., Nakamura, M., Kudo, K., Tanaka, K., Electron. Commun. Jpn, Part 2 87, 18 (2004)
Miskiewicz, P., Mas-Torrent, M., Jung, J., Kotarba, S., Glowacki, I., Gomar-Nadal, E., Amabilino, D.B., Veciana, J., Krause, B., Carbone, D., Rovira, C., Ulanski, J., Chem. Mater. 18, 4724 (2006) CrossRef
Duffy, C.M., Andreasen, J.W., Breiby, D.W., Nielsen, M.M., Ando, M., Minakata, T., Sirringhaus, H., Chem. Mater. 20, 7252 (2008) CrossRef
Suzuki, A., J. Organomet. Chem. 576, 147 (1999) CrossRef
Melucci, M., Barbarella, G., Zambianchi, M., Di Pietro, P., Bongini, A., J. Org. Chem. 69, 4821 (2004) CrossRef
Zang, S., Guo, Y., Ch, H. Xi. Di, J. Yu, K. Zheng, R. Liu, X. Zhan, Y. Liu, Thin Solid Films 517, 2968 (2009) CrossRef
Melucci, M., Favaretto, L., Bettini, Ch., Gazzano, M., Camaioni, N., Maccagnani, P., Ostoja, P., Monari, M., Barbarella, G., Chem. Eur. J. 36, 10007 (2007) CrossRef