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Novel MgO/SiO2 double protective layers to prevent Ag mirror degradation

Published online by Cambridge University Press:  17 June 2010

S.-J. Choi
Affiliation:
Image Architecture Lab, Semiconductor R&D center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
K.-H. Kim*
Affiliation:
AE group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
J.-H. Jo
Affiliation:
Advanced R&D group 3, Digital Printing Division, Samsung Electronics Co. Ltd., Suwon, 443-370, Republic of Korea
S.-J. Kwon
Affiliation:
Department of Material Science & Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
S. Cho
Affiliation:
Department of Physics, College of Science and Technology, Yonsei University, Wonju, 220-710, Republic of Korea
H. Oh
Affiliation:
Image Architecture Lab, Semiconductor R&D center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
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Abstract

We demonstrate a very stable silver-coated mirror exploiting novel MgO/SiO2 double layers. It was found that the MgO/SiO2 protective layer provides a good adhesion and protection to the silver surface. Using epoxy-Ti(40 nm)-Ag(60 nm)-MgO(5~10 nm)-SiO2(25 nm) mirror structures, we achieved over 95% reflectivity and observed a minimal degradation in reflectance even after severe environmental tests.

Type
Research Article
Copyright
© EDP Sciences, 2010

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