Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
André, J.‐M.
Jonnard, P.
and
Benbalagh, R.
2007.
Multilayer interference mirrors as components for soft x‐ray WDS monochromators and tunable radiation sources.
X-Ray Spectrometry,
Vol. 36,
Issue. 2,
p.
62.
Maury, H.
Jonnard, P.
Le Guen, K.
André, J. -M.
Wang, Z.
Zhu, J.
Dong, J.
Zhang, Z.
Bridou, F.
Delmotte, F.
Hecquet, C.
Mahne, N.
Giglia, A.
and
Nannarone, S.
2008.
Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers.
The European Physical Journal B,
Vol. 64,
Issue. 2,
p.
193.
Jonnard, P.
Le Guen, K.
and
André, J.‐M.
2009.
High‐resolution x‐ray analysis with multilayer gratings.
X-Ray Spectrometry,
Vol. 38,
Issue. 2,
p.
117.
Jonnard, Philippe
Maury, Hélène
Le Guen, Karine
André, Jean-Michel
Mahne, Nicola
Giglia, Angelo
Nannarone, Stefano
and
Bridou, Françoise
2010.
Effect of B4C diffusion barriers on the thermal stability of Sc/Si periodic multilayers.
Surface Science,
Vol. 604,
Issue. 11-12,
p.
1015.
André, J.-M.
Le Guen, K.
Jonnard, P.
and
Ménesguen, Y.
2011.
DUVEX: An X-ray counting system based on YAG:Ce scintillator.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 659,
Issue. 1,
p.
318.
Jonnard, P.
Le Guen, K.
André, J.‐M.
Coudevylle, J.‐R.
and
Isac, N.
2012.
An etched multilayer as a dispersive element in a curved‐crystal spectrometer: implementation and performance.
X-Ray Spectrometry,
Vol. 41,
Issue. 5,
p.
308.
Yuan, Yanyan
Guen, Karine Le
André, Jean-Michel
Wang, Zhanshan
Li, Haochuan
Zhu, Jingtao
Mény, Christian
Giglia, Angelo
Nannarone, Stefano
and
Jonnard, Philippe
2014.
Co/Mo2
C multilayer as X-ray mirror: Optical and thermal performances.
physica status solidi (b),
Vol. 251,
Issue. 4,
p.
803.
Le Guen, Karine
Benbalagh, Rabah
André, Jean-Michel
Coudevylle, Jean-René
and
Jonnard, Philippe
2017.
Design, development and applications of etched multilayers for soft X-ray spectroscopy.
The European Physical Journal Applied Physics,
Vol. 78,
Issue. 2,
p.
20702.