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Microstructure, dielectric and ferroelectric characterization of Ba doped PLZT ceramics

Published online by Cambridge University Press:  23 June 2006

K. Ramam  and
V. Miguel
K. Ramam*
Affiliation:
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
V. Miguel
Affiliation:
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
*
[email protected]
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Abstract

Ba doped PLZT ceramic compositions with formula Pb0.982−z La0.012Δ0.006Baz (Zr0.55Ti0.45)O3 for z = 0 to 6 mole% are synthesized by mixed-oxide method. Powder XRD studies indicate the coexistence of rhombohedral and tetragonal phase in 5 mole% Ba doped PLZT composition. SEM pictures show grain size control as Ba concentration increases in PLZT system. $\varepsilon_{rt}$ and tan δ are increased up to 4 mole% and 5 mole% Ba doped PLZT composition respectively. Dielectric maximum ( $\varepsilon_{T_C}$ ) is decreased to 4 mole% Ba doped PLZT and Curie temperature (T C ) is decreased with increase of Ba concentration in PLZT system. Coercive field (E c ) has shown gradual enhancement over series. Remanent (P r ) and spontaneous (P s ) polarizations are decreased to 5 mole% Ba doped PLZT composition.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 35 , Issue 1 , July 2006 , pp. 43 - 47
Copyright
© EDP Sciences, 2006

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