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Investigation of the structural, optical and electrical properties of Nd-doped ZnO thin films deposited by spray pyrolysis

Published online by Cambridge University Press:  31 January 2013

A. Douayar ,
P. Prieto ,
G. Schmerber ,
K. Nouneh ,
R. Diaz ,
I. Chaki ,
S. Colis ,
A. El Fakir ,
N. Hassanain  and
A. Belayachi
...Show all authors
A. Douayar
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
P. Prieto
Affiliation:
Departmento de Física Aplicada C-XII, Universidad Autόnoma de Madrid, Madrid, Spain
G. Schmerber
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
K. Nouneh
Affiliation:
MASCIR Moroccan Advanced Science, Innovation and Research Foundation, ENSET, Av. Armée Royale, Rabat, Morocco
R. Diaz
Affiliation:
Departmento de Física Aplicada C-XII, Universidad Autόnoma de Madrid, Madrid, Spain
I. Chaki
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
S. Colis
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
A. El Fakir
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
N. Hassanain
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
A. Belayachi
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
Z. Sekkat
Affiliation:
MASCIR Moroccan Advanced Science, Innovation and Research Foundation, ENSET, Av. Armée Royale, Rabat, Morocco
A. Slaoui
Affiliation:
InESS, UMR CNRS 7163 UDS, 23 rue du Loess, B.P. 43, 67037 Strasbourg, France
A. Dinia
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
M. Abd-Lefdil*
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
*
ae-mail: [email protected]
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Abstract

Neodymium-doped zinc oxide (NZO) thin films were deposited on glass substrates by spray pyrolysis technique. X-ray diffraction patterns have shown that both undoped and Nd-doped ZnO films exhibit the hexagonal wurtzite crystal structure with a preferential orientation along [0 0 2] direction.

The effective doping concentration has been determined by Rutherford backscattering measurements showing that the neodymium is not incorporated easily into ZnO host matrix. The surface roughness was shown to increase with Nd doping. NZO films are highly transparent in the visible region. The lowest electrical resistivity value of about 4.0 10−2 Ω cm was obtained for 1% Nd effective doping.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 61 , Issue 1 , January 2013 , 10304
Copyright
© EDP Sciences, 2013

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References

Fan, Z., Wang, D., Chang, P., Tseng, W., Lu, J.E., Appl. Phys. Lett. 85, 5932 (2004)
Contreras, M.A., Egaas, B., Ramanathan, K., Hiltner, J., Swartzlander, A., Hasoon, F., Noufi, R., Prog. Photovolt. Res. Appl. 7, 311(1999)3.0.CO;2-G>CrossRef
Wan, Q., Li, Q.H., Chen, Y.J., Wang, T.H., He, X.L., Li, J.P., Lin, C.L., Appl. Phys. Lett. 84, 3654 (2004)CrossRef
Fortunato, E.M.C., Barquinka, P.M.C., Pimental, A.C.M.B.G., Goncalves, A.M.F., Marques, A.J., Pereira, L.M.N., Martins, R.F.P., Adv. Mat. 17, 590 (2005)CrossRef
Trupke, T., Green, M.A., Wurfel, P., J. Appl. Phys. 92, 1668 (2002)CrossRef
Petersen, J., Brimont, C., Gallart, M., Crégut, O., Schmerber, G., Gilliot, O., Hönerlage, B., Ulhaq-Bouillet, C., Rehspringer, J.L., Leuvrey, C., Colis, S., Slaoui, A., Dinia, A., J. Appl. Phys. 104, 113539 (2008)CrossRef
Djurišić, A.B., Ng, A.M.C., Chen, X.Y., Prog. Quant. Electr. 34, 191 (2010)CrossRef
Oyola, J.S., Castro, J.M., Gordillo, G., Solar Energy Mater. Solar Cells 102, 137 (2012)CrossRef
Belghazi, Y., Schmerber, G., Colis, S., Rehspringer, J.L., Berrada, A., Dinia, A., J. Magn. Magn. Mater. 310, 2092 (2007)CrossRef
Zhu, H., Hüpkes, J., Bunte, E., Owen, J., Huang, S.M., Solar Energy Mater. Solar Cells 95, 964 (2011)CrossRef
Soumahoro, I., Moubah, R., Schmerber, G., Colis, S., Ait Aouaj, M., Abd-lefdil, M., Hassanain, N., Berrada, A., Dinia, A., Thin Solid Films 518, 4593 (2010)CrossRef
Tripathi, S., Choudhary, R.J., Tripathi, A., Branwa, V., Pandey, A.C., Gerlach, J.W., Dar, C., Kanjilal, D., Nucl. Instrum. Methods Phys. Res. B: Beam Interact. Mater. Atoms 266, 1533 (2008)CrossRef
Ndilimabaka, H., Colis, S., Schmerber, G., Muller, D., Grob, J.J., Gravier, L., Jan, C., Beaurepaire, E., Dinia, A., Chem. Phys. Lett. 421, 184 (2006)CrossRef
Zhang, C., J. Phys. Chem. Solids 71, 364 (2010)CrossRef
Douayar, A., Diaz, R., CherkaouiElMoursli, F., Schmerber, G., Dinia, A., Abd-Lefdil, M., Eur. Phys. J. Appl. Phys. 53, 20501 (2011)CrossRef
Shinde, S.D., Patil, G.E., Kajale, D.D., Gaikwad, V.B., Jain, G.H., J. Alloys Compd. 528, 109 (2012)CrossRef
Bouloudenine, M., Viart, N., Colis, S., Dinia, A., Catal. Today 113, 240 (2006)CrossRef
Soumahoro, I., Schmerber, G., Douayar, A., Colis, S., Abd-Lefdil, M., Hassanain, N., Berrada, A., Muller, D., Slaoui, A., Rinnert, H., Dinia, A., J. Appl. Phys. 109, 33708 (2011)CrossRef
Petersen, J., Brimont, C., Gallart, M., Schmerber, G., Gilliot, P., Ulhaq-Bouillet, C., Rehspringer, J. L., Colis, S., Becker, C., Slaoui, A., Dinia, A., J. Appl. Phys. 107, 123522 (2010)CrossRef
Chang, G.S., Kurmaev, E.Z., Boukhvalov, D.W., Finkelstein, L.D., Moewes, A., Bieber, H., Colis, S., Dinia, A., J. Phys. Condens. Matter 21, 056002 (2009)CrossRef
Roy, B., Karmakar, B., Nambissan, P.M.G., Pal, M., NANO: Brief Reports and Reviews 6, 173 (2011)CrossRef
Ungureanu, M., Schmidt, H., Xu, Q., von Wenckstern, H., Spemann, D., Hochmuth, H., Lorenz, M., Grundmann, M., Superlattices Microstruct. 42, 231 (2007)CrossRef
Subramanian, M., Thakur, P., Gautam, S., Chae, K.H., Tanemura, M., Hihara, T., Vijayalakshmi, S., Kim, S.S., Asokan, K., Jayavel, R., J. Phys. D: Appl. Phys. 42, 105410 (2009)CrossRef
Lardé, R., Talbot, E., Pareige, P., Bieber, H., Schmerber, G., Colis, S., Pierron-Bohnes, V., Dinia, A., J. Am. Chem. Soc. 133, 1451 (2011)CrossRef
Shinde, S.R., Ogale, S.B., Higgins, J.S., Zheng, H., Millis, A.J., Kulkarni, V.N., Ramesh, R., Greene, R.L., Venkatesan, T., Phys. Rev. Lett. 92, 166601 (2004)CrossRef
Roy, B., Chakrabarty, S., Mondal, O., Pal, M., Dutta, A., Mater. Charact. 70, 1 (2012)CrossRef
Liu, T. Y., Luo, W., Li, R., Zhu, H., Chen, X., Optic Express 17, 9748 (2009)CrossRef
Climent-Font, A., Pászti, F., García, G., Fernández-Jiménez, M.T., Agullό, F., Nucl. Instr. Meth. B 219–220, 400 (2004)CrossRef
Cheng, H.-S., Shen, H., Tang, J., Yang, F., Nucl. Instr. Meth. B 83, 449 (1993)
Mayer, M., SIMNRA User’s Guide, IPP 9/113 (1997)
Xian, F., Li, X., Opt. Laser Technol. 45, 508 (2013)CrossRef
Prabahar, S., Dhanam, M., J. Cryst. Growth 285, 41 (2005)CrossRef
Kahraman, S., Bayansal, F., Çetinkara, H.A., Çakmak, H.M., Güder, H.S., Mater. Chem. Phys. 134, 1036 (2012)CrossRef
Shannon, R.D., Acta Cryst. A 32, 751 (1976)CrossRef
Zheng, J.H., Song, J.L., Zhao, Z., Jiang, Q., Lian, J.S., Cryst. Res. Technol. 47, 713 (2012)CrossRef
Belghazi, Y., Ait Aouaj, M., El Yadari, M., Schmerber, G., Ulhaq-Bouillet, C., Leuvrey, C., Colis, S., Abd-lefdil, M., Berrada, A., Dinia, A., Microelectronics 40, 265 (2009)CrossRef
Kim, T.K.J., Park, Y.R., Appl. Phys. Lett. 81, 1420 (2002)CrossRef
Shinde, V.R., Gujar, T.P., Lokhande, C.D., Mane, R.S., Han, S.H., Mater. Chem. Phys. 96, 326 (2006)CrossRef
Petersen, J., Brimont, C., Gallart, M., Crégut, O., Schmerber, G., Gilliot, P., Hönerlage, B., Ulhaq-Bouillet, C., Rehspringer, J. L., Leuvrey, C., Colis, S., Slaoui, A., Dinia, A., Microelectronics 40, 239 (2009)CrossRef
Rinnert, H., Miska, P., Vergnat, M., Schmerber, G., Colis, S., Dinia, A., Muller, D., Ferblantier, G., Slaoui, A., Appl. Phys. Lett. 100, 101908 (2012)CrossRef