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Intraband light absorption in free-standing porous silicon

Published online by Cambridge University Press:  18 May 2011

R. S. Dariani  and
N. Rahmani
R. S. Dariani*
Affiliation:
Department of Physics, Alzahra University, 19938, Tehran, Iran
N. Rahmani
Affiliation:
Department of Physics, Alzahra University, 19938, Tehran, Iran
*
ae-mail: [email protected]
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Abstract

We have prepared free-standing porous silicon (FPS) samples with various porosities using electrochemical etching. The result of a study combining absorption and photoluminescence (PL) from FPS samples with porosities in the range 53–76% is presented. A blue shift of the PL peak position and an increase of the PL intensity with enhancing porosity have been observed. Furthermore, the PL peak and intensity of porous silicon (PS) samples are compared with FPS samples. Our results show that the PL peak intensity reduces 1.5–2.5 times from PS to FPS. However, no notable shift of the PL peak position from PS to FPS has been observed.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 54 , Issue 2: Focus on Fuel Cells 2009 , May 2011 , 21301
Copyright
© EDP Sciences, 2011

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References

Canham, L.T., Appl. Phys. Lett. 57, 1046 (1990) CrossRef
Khalili, H., Dariani, R.S., MortezaAli, A., Daadmehr, V., Robbie, K., J. Mater. Sci. 42, 908 (2007) CrossRef
Bisi, O., Ossicini, S., Pavesi, L., Surf. Sci. Rep. 38, 5 (2000) CrossRef
Lehmann, V., Gusele, U., Appl. Phys. Lett. 58, 586 (1991) CrossRef
Tischler, M.A., Collins, R.T., Stathis, J.H., Tsang, J.C., Appl. Phys. Lett. 60, 639 (1992) CrossRef
Delerue, C., Allan, G., Lannoo, M., Phys. Rev. B 48, 11024 (1993) CrossRef
Wolkin, M., Jorne, J., Fauchet, P.M., Allan, G., Delerue, C., Phys. Rev. Lett. 82, 197 (1999) CrossRef
Li, W., Andrienko, I., Haneman, D., J. Appl. Phys. 88, 316 (2000) CrossRef
Kovalev, D., Polisski, G., Ben-Chorin, M., Diener, J., Koch, F., J. Appl. Phys. 80, 5987 (1996) CrossRef
Wolf, A., Brendel, R., Thin Solid Films 513, 385 (2006) CrossRef
Kanemitsu, Y., Uto, H., Masumoto, Y., Matsumoto, T., Futagi, T., Misura, H., Phys. Rev. B 48, 2827 (1993) CrossRef
Proot, J.P., Delerue, C., Allan, G., Appl. Phys. Lett. 61, 1948 (1992) CrossRef
Torchinskaya, T.V., Korsunskaya, N.E., Khomenkova, L.Y.U., Dhumaev, B.R., Prokes, S.M., Thin Solid Films 381, 88 (2001) CrossRef