Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-26T05:59:25.280Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of long-term defect diffusion on HgCdTe electronic structure

Published online by Cambridge University Press:  15 July 2004

M. Pociask ,
B. Pukowska ,
A. Kisiel ,
E. M. Sheregii  and
N. N. Berchenko
M. Pociask*
Affiliation:
Institute of Physics, University of Rzeszów, 16A2 Rejtana Str., 35-310 Rzeszów, Poland
B. Pukowska
Affiliation:
Institute of Physics, Jagiellonian University, 4 Reymonta Str., 30-059 Kraków, Poland
A. Kisiel
Affiliation:
Institute of Physics, Jagiellonian University, 4 Reymonta Str., 30-059 Kraków, Poland
E. M. Sheregii
Affiliation:
Institute of Physics, University of Rzeszów, 16A2 Rejtana Str., 35-310 Rzeszów, Poland
N. N. Berchenko
Affiliation:
Institute of Physics, University of Rzeszów, 16A2 Rejtana Str., 35-310 Rzeszów, Poland
*
[email protected]
Get access

Abstract

The long-term diffusion processes of defects in HgxCd$_{1-x}$Te mixed crystals were investigated. Measurements of reflectivity and surface characterisation by means of scanning electron microscopy (SEM) were performed for samples with x = 0.4 and x = 0.62. The experiments were repeated after wet chemical etching. Optical results were compared with the reflectivity spectra obtained 20 years ago using the same samples of investigated material. We discuss the observed large changes in the optical spectra on the basis of comparative analysis and SEM results.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 27 , Issue 1-3: Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X) , July 2004 , pp. 403 - 406
Copyright
© EDP Sciences, 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Rodzik, A., Kisiel, A., J. Phys. C: Solid State Phys. 16, 203 (1983) CrossRef
Voronkov, V. P., Gurchenok, G. A., Fiz. Tekh. Poluprovodnikov 24, 1831 (1990)
Kuźma, M., Abeynayake, C., Sheregii, E., Virt, I., Acta Phys. Pol. A 80, 475 (1991) CrossRef
Ciach, R., Faryna, M., Kuźma, M., Pociask, M., Sheregii, E., Thin Solid Films 241, 151 (1994) CrossRef
Ciach, R., Faryna, M., Kuźma, M., Pociask, M., Sheregii, E., J. Cryst. Growth 161, 234 (1996) CrossRef
M. Pociask, E. M. Sheregii, Proc. NGS 10, IPAP Conf., Series 2, 80 (2001)
Sheregii, E. M., Pociask, M. M., Kuźma, M., Proc. SPIE 4413, 45 (2001) CrossRef
Cahn, J. W., Trans. AIME 242, 166 (1968)
A. G. Khachaturyan, Theory of Structural Transformations in Solids (Wiley, New York, 1983)
Kisiel, A., Podgorny, M., Rodzik, A., Turowski, M., Opt. Appl. 9, 249 (1979)
Chelikowsky, J. R., Cohen, M. L., Phys. Rev. B 14, 556 (1976) CrossRef
Ivanov-Omskii, V. I., Berchenko, N. N., Elizarov, A. I., Phys. Stat. Sol. A 103, 11 (1987) CrossRef
Yu, Zhonghai, Mattison, M. A., Meyers, T. H., Harris, K. A., Yanka, R. W., Mohnkern, L. M., Lew Yan Voon, L. C., Ram-Mohan, L. R., Benz, R. G. II, Wagner, B. K., Summers, C. J., J. Electron. Mater. 24, 685 (1995) CrossRef