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In situ break-junction sample holder for transmission electron microscopy

Published online by Cambridge University Press:  09 December 2013

Santhana K. Eswara Moorthy ,
Gerald Le Goff ,
Michel Viret  and
Mathieu Kociak
Santhana K. Eswara Moorthy*
Affiliation:
Laboratoire de Physique des Solides, CNRS, UMR 8502 Université Paris Sud, 91405 Orsay, France
Gerald Le Goff
Affiliation:
Service de Physique de l’Etat Condensé, URA CNRS 2464 CEA/DSM/IRAMIS/SPEC Orme des Merisiers, 91191 Gif-sur-Yvette, France
Michel Viret
Affiliation:
Service de Physique de l’Etat Condensé, URA CNRS 2464 CEA/DSM/IRAMIS/SPEC Orme des Merisiers, 91191 Gif-sur-Yvette, France
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, CNRS, UMR 8502 Université Paris Sud, 91405 Orsay, France
*
ae-mail: [email protected]
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Abstract

In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instrumentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 64 , Issue 3 , December 2013 , 31001
Copyright
© EDP Sciences, 2013

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