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Imaging subwavelength holes in chromium films inscanning near-field optical microscopy. Comparison betweenexperiments and calculation

Published online by Cambridge University Press:  04 March 2004

S. Ducourtieux
Affiliation:
CNRS UPR and Univ. P. et M. Curie., Lab. d'Optique Physique, ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05, France
S. Grésillon
Affiliation:
CNRS UPR and Univ. P. et M. Curie., Lab. d'Optique Physique, ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05, France
J. C. Rivoal*
Affiliation:
CNRS UPR and Univ. P. et M. Curie., Lab. d'Optique Physique, ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05, France
C. Vannier
Affiliation:
Laboratoire d'Optique P.M. Duffieux, CNRS UMR 6603, Université de Franche-Comté, 25030 Besançon Cedex, France
C. Bainier
Affiliation:
Laboratoire d'Optique P.M. Duffieux, CNRS UMR 6603, Université de Franche-Comté, 25030 Besançon Cedex, France
D. Courjon
Affiliation:
Laboratoire d'Optique P.M. Duffieux, CNRS UMR 6603, Université de Franche-Comté, 25030 Besançon Cedex, France
H. Cory
Affiliation:
Department of Electrical Engineering, Technion – Israel Institute of Technology, Haifa 32000, Israel
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Abstract

Near-field optical signals are imaged in the vicinity of nano-holes using two different near-field optical microscopes. The experimental results are compared with electromagnetic field calculations based on a modal approximation. It turns out that an optical fibre detects the Poynting vector whereas the apertureless tip is sensitive to the field amplitude.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2004

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References

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