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High frequency characterization of the thin film ferrites BaM and YIG

Published online by Cambridge University Press:  28 June 2007

Z. Zerrougui ,
A. Merzouki  and
D. Vincent
Z. Zerrougui*
Affiliation:
Département d'électronique, Faculté des sciences de l'ingénieur, Université Ferhat Abbes, Setif, Algeria
A. Merzouki
Affiliation:
Département d'électronique, Faculté des sciences de l'ingénieur, Université Ferhat Abbes, Setif, Algeria
D. Vincent
Affiliation:
Laboratoire DIOM, ISTASE, Saint-Étienne, France
*
[email protected]
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Abstract

New microwave electronic technology challenges require the integration of many passive components onto chips. Among them, isolators and circulators are non-reciprocal passive devices that contain magnetic materials. It is therefore important to know the magnetic properties of suitable materials. The permeability tensor is the most important parameter to define, because it governs the interaction between the electromagnetic wave and the material, and is thus the origin of all magnetic phenomenons. Our work consists of performing the characterization of thin films of BaM and YIG over a frequency range of 0.4 GHz to 65 GHz. The work shows the presence of a gyroresonance phenomenon and locates the resonance frequencies. The technique is based on S parameter measurements on the magnetic materials performed with a network analyser and a probe tester. Polder's model is used to calculate the different elements of the permeability tensor, which consider the ferrite in its saturated state.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 39 , Issue 1 , July 2007 , pp. 45 - 50
Copyright
© EDP Sciences, 2007

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