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Full field imaging of isolated metallic nano objects

Published online by Cambridge University Press:  30 May 2009

E. Absil ,
G. Tessier ,
D. Fournier ,
M. Gross  and
M. Atlan
E. Absil
Affiliation:
École Supérieure de Physique et Chimie Industrielles de la Ville de Paris, CNRS UPR 5, Université Pierre et Marie Curie Paris 6, 10 rue Vauquelin, 75231 Paris Cedex 05, France
G. Tessier*
Affiliation:
École Supérieure de Physique et Chimie Industrielles de la Ville de Paris, CNRS UPR 5, Université Pierre et Marie Curie Paris 6, 10 rue Vauquelin, 75231 Paris Cedex 05, France
D. Fournier
Affiliation:
École Supérieure de Physique et Chimie Industrielles de la Ville de Paris, CNRS UPR 5, Université Pierre et Marie Curie Paris 6, 10 rue Vauquelin, 75231 Paris Cedex 05, France
M. Gross
Affiliation:
École Normale Supérieure, CNRS UMR 8552, Université Pierre et Marie Curie Paris 6, 24 rue Lhomond, 75231 Paris Cedex 05, France
M. Atlan
Affiliation:
École Normale Supérieure, CNRS UMR 8552, Université Pierre et Marie Curie Paris 6, 24 rue Lhomond, 75231 Paris Cedex 05, France
*
[email protected]
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Abstract

Since the detection of nanoparticles is a major issue in nano sciences, we have developed two instruments for the fast imaging of individual nano objects. The first one is based on a spatial modulation of the sample using an incoherent dark field illumination and a multiplexed lock in detection.The second instrument uses digital heterodyne holography. Both instruments make it possible to achieve a high signal-to-noise ratio and therefore to detect very low signal.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 47 , Issue 1: 4th Colloquium Interdisciplinary in Instrumentation (C2I 2007) , July 2009 , 12704
Copyright
© EDP Sciences, 2009

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References

Maier, S.A., Curr. Nanosci. 1, 17 (2005) CrossRef
Stellacci, F., Bauer, C.A., Meyer-Friedrichsen, T., Wenseleers, W., Alain, V., Knebler, S.M., Pond, S.J.K., Zhang, Y., Marder, S.R., Perry, J.W., Adv. Mater. 14, 194 (2002) 3.0.CO;2-W>CrossRef
Kalkbrenner, T., Ramstein, M., Mlynek, J., Sandoghdar, V., J. Microsc. 202, 72 (2001) CrossRef
Lasne, D., Blab, G.A., Berciaud, S., Heine, M., Groc, L., Choquet, D., Cognet, L., Lounis, B., Biophys. J. 91, 4598 (2006) CrossRef
Enoch, S., Quidant, R., Badenes, G., Opt. Expr. 12, 3422 (2004) CrossRef
Berciaud, S., Lasne, D., Blab, G.A., Cognet, L., Lounis, B., Phys. Rev. B 73, 045424 (2006) CrossRef
Arbouet, A., Christofilos, D., Del Fatti, N., Vallée, F., Huntzinger, J.R., Arnaud, L., Billaud, P., Broyer, M., Phys. Rev. Lett. 93, 127401 (2004) CrossRef
B.D. Murphy, Fundamentals of Light Microscopy and Electronic Imaging (John Wiley & Sons, New York, 2001)
Boyer, D., Tamarat, P., Maali, A., Lounis, B., Orritz, M., Science 297, 1160 (2002) CrossRef
Gleyzes, P., Guernet, F., Boccara, A.C., J. Opt. 26, 251 (1995) CrossRef
Johnson, P.B., Christy, R.W., Phys. Rev. B 6, 4370 (1972) CrossRef
Gross, M., Atlan, M., Absil, E., Appl. Opt. 47, 1757 (2008) CrossRef
Gross, M., Atlan, M., Opt. Lett. 32, 909 (2007) CrossRef