Hostname: page-component-745bb68f8f-g4j75 Total loading time: 0 Render date: 2025-01-12T21:47:12.638Z Has data issue: false hasContentIssue false
  • English
  • Français

Free surface deformation of irradiated thin slabs

Published online by Cambridge University Press:  01 October 2002

D. Lesueur ,
J. Colin  and
J. Grilhé
D. Lesueur
Affiliation:
Département de Recherche sur l'État Condensé, les Atomes et les Molécules, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France
J. Colin*
Affiliation:
Laboratoire de Métallurgie Physique, SP2MI, Bd 2, Teleport 2, 86960 Futuroscope Cedex, France
J. Grilhé
Affiliation:
Laboratoire de Métallurgie Physique, SP2MI, Bd 2, Teleport 2, 86960 Futuroscope Cedex, France
*
[email protected]
Get access

Abstract

An analytical method is proposed to calculate the free surface deformation induced by an inclusion embedded in a thin slab. The displacement of the free surface has been determined with the help of the 2D Fourier transformation, as well as the momenta of the displacements when they exist. Comparing the deformations induced by the same inclusion in a semi-infinite medium and in a slab, it has been demonstrated that the deformations in the slab are much more localized than in a semi-infinite solid. A simple example is finally given concerning a latent track induced by swift heavy ion going through a solid.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 20 , Issue 1 , October 2002 , pp. 15 - 21
Copyright
© EDP Sciences, 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Kamins, T.I., Nauka, K., Kruger, J.B., Hoyt, J.L., King, C.A., Noble, D.B., Gronet, C.M., Gibbons, J.F., IEEE Electron Device Lett. 10, 503 (1989) CrossRef
Schowater, L.J., MRS Bull. 21, 45 (1996)
A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton, C.T. Forwood, Computed Electron Micrographs and Defect Identification (North-Holland Publishing Company, Amsterdam, 1973)
Binnig, G., Quate, C.F., Gerber, C., Phys. Rev. Lett. 56, 930 (1986) CrossRef
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan, Electron Microscopy of thin crystals, edited by R.E. Krieger (Publishing Co., INC., Krieger Drive, Malabar, Florida, 1965)
Coupeau, C., Naud, J.F., Cleymand, F., Goudeau, P., Grilhé, J., Thin Solid Films 353, 194 (1999) CrossRef
Audouard, A., Mamy, R., Toulemonde, M., Szenes, G., Thomé, L., Europhys. Lett. 40, 527 (1997) CrossRef
Herbig, J., Reimann, C.T., Bergqvist, M., Oscarsson, S., Vorobyova, I.V., Nucl. Instrum. Methods. Phys. Res., Sect. B Beam Interact. Mater. Atoms 149, 119 (1999) CrossRef
Tromas, C., Girard, J.C., Woirgard, J, Philos. Mag. A 80, 2325 (2000) CrossRef
Fuchs, G., Studer, F., Balanza, E., Groult, D., Toulemonde, M., Jousset, J.C., Europhys. Lett. 3, 321 (1987) CrossRef
Daya, B., Hallen, D.D.N., Hakansson, P., Sundqvist, B.U.R., Reimann, C.T., Nucl. Instrum. Methods. Phys. Res., Sect. B Beam Interact. Mater. Atoms 103, 454 (1995)
Barbu, A., Dunlop, A., Lesueur, D., Averback, R.S., Europhys. Lett. 15, 765 (1991)
J. Dundurs, D.L. Guell, in Developments in Theoretical and Applied Mechanics (Oxford: Pergamon Press, 1965), Vol. 2, pp. 199-211
Chou, Y.T., Phys. Stat. Sol. 17, 509 (1996) CrossRef
Stagni, L., Lizzio, R., J. Appl. Mech. 59, 215 (1992) CrossRef
Sburlati, R., Madenci, E., Guven, I., J. Appl. Mech. 67, 590 (2000) CrossRef
H.Y. Yu, S.C. Sanday, J. Appl. Mech. 57/75, 74 (1990)
Yu, H.Y., Sanday, S.C., Proc. Roy. Soc. London A 438, 103 (1992) CrossRef
Colin, J., Lesueur, D., Grilhé, J., Philos. Mag. 81, 857 (2001) CrossRef
L.D. Landau, E.M. Lifshitz, Theory of Elasticity (Pergamon Press, New York, 1986)
T. Mura, Micromechanics of Defects in Solids, edited by S. Nemat-Nasser, G. Oravas (Martinus Nijhoff Publishers, 1987)