Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-26T15:41:44.244Z Has data issue: false hasContentIssue false
  • English
  • Français

Focusing effect in X-ray diffraction imaging of LiNbO3crystals under static electric field

Published online by Cambridge University Press:  15 December 1999

P. Pernot-Rejmánková ,
W. Laprus  and
J. Baruchel
P. Pernot-Rejmánková*
Affiliation:
European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France
W. Laprus
Affiliation:
Polish Academy of Sciences, Swietokrzyska 21, 00049 Warszawa, Poland
J. Baruchel
Affiliation:
European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France
*
[email protected]
Get access

Abstract

The X-ray diffracted intensity changes considerably when a static electric field is applied perpendicularly to a X- or Y-cut LiNbO3 platelet-shaped crystal. Section diffraction images (topographs) recorded using synchrotron radiation in transmission mode reveal the curvature of the lattice planes under such a field. A theoretical analysis based on the equations of electro-mechanical field in a piezoelectric medium together with chemical etching experiments allows us to explain this effect. Tiny inverted ferroelectric doMayns produced by the applied field exert a strain on the non-inverted bulk leading to the observed curvature of the lattice planes. This approach seems to be valid for other piezoelectric crystals of various symmetry classes.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 8 , Issue 3 , December 1999 , pp. 225 - 232
Copyright
© EDP Sciences, 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Rejmánková, P., Baruchel, J., Moretti, P., Physica B 226, 293 (1996). CrossRef
Abrahams, S.C., Marsh, P., Acta Cryst. B 42, 61 (1986). CrossRef
Gopalan, V., Mitchell, T.E., Furukawa, Y., Kitamura, K., Appl. Phys. Lett. 72, 1981 (1998). CrossRef
Nassau, K., Levinstein, H.J., Loiacono, G.M., J. Phys. Chem. Solids 27, 989 (1966). CrossRef
Weis, R.S., Gaylord, T.K., Appl. Phys. A 37, 191 (1985). CrossRef
X-ray and Neutron Dynamical Diffraction: Theory and Applications, NATO ASI Series, Series B: Physics, edited by A. Authier, S. Lagomarsino, B.K. Tanner (Plenum Press, New York, 1996), Vol. 357.
Miyazawa, S., J. Appl. Phys. 50, 4599 (1979). CrossRef
Ohnishi, N., Iizuka, T., J. Appl. Phys. 46, 1063 (1975). CrossRef
Kato, N., J. Phys. Soc. Jap. 19, 971 (1964). CrossRef
Green, G.S., Loxley, N., Tanner, B.K., J. Appl. Cryst. 24, 304 (1991). CrossRef
Laprus, W., Danicki, E., J. Appl. Phys. 81, 855 (1997). CrossRef
Gualtieri, J.G., Kosinski, J.K., Ballato, A., IEEE Trans. Ultrason. Ferroel. Freq. Control 41, 53 (1994). CrossRef
Chu, D.K.T., Bierlein, J.D., Hunsperger, R.G., IEEE Trans. Ultrason. Ferroel. Freq. Control 39, 683 (1992). CrossRef
Landolt-Börnstein, in Numerical and Functional Relationships in Science and Technology, New Series (Springer, New York, 1979), Vol. III, No. 11.
Yamada, M., Nada, N., Saitoh, M., Watanabe, K., Appl. Phys. Lett. 62, 435 (1993). CrossRef
Rejmánková, P., Baruchel, J., Kulda, J., Philos. Mag. B 75, 871 (1997). CrossRef
Rejmánková, P., Baruchel, J., Kulda, J., Calemczuk, R., Salce, B., J. Phys. D: Appl. Phys. 28, A69 (1995). CrossRef