Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-20T08:39:13.191Z Has data issue: false hasContentIssue false

Electron beam induced light emission

Published online by Cambridge University Press:  17 April 2009

A. Ulrich*
Affiliation:
Physik Department E12, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany
T. Heindl
Affiliation:
Physik Department E12, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany
R. Krücken
Affiliation:
Physik Department E12, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany
A. Morozov
Affiliation:
Physik Department E12, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany
C. Skrobol
Affiliation:
Physik Department E12, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany
J. Wieser
Affiliation:
Coherent GmbH, Zielstatt-Str. 32, 81379 München, Germany
Get access

Abstract

Electron beams with a particle energy of typically 12 keV are used for collisional excitation of dense gases. The electrons are sent through ceramic membranes of only 300 nm thickness into gas targets. Excimer light emission from the pure rare gases and from gas mixtures are studied for the development of brilliant VUV and UV light sources. The application of the technology for gas kinetic studies is described and its potential for building very small electron beam pumped lasers is discussed.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Wieser, J., Murnick, D.E., Ulrich, A., Huggins, H.A., Liddle, A., Brown, W.L., Rev. Sci. Instrum. 68, 1360 (1997) CrossRef
Lenard, P., Ann. d. Phys. u. Chem. 51, 225 (1894) CrossRef
Valkealathi, S., Schou, J., Nieminen, R.M., J. Appl. Phys. 65, 2258 (1989) CrossRef
Hovington, P., Drouin, D., Gauvin, R., Scanning 19, 1 (1997) CrossRef
Morozov, A., Krücken, R., Ulrich, A., Wieser, J., J. Appl. Phys. 100, 093305 (2006) CrossRef
Morozov, A., Heindl, T., Skrobol, C., Wieser, J., Krücken, R., Ulrich, A., Eur. Phys. J. D 48, 383 (2008) CrossRef
Morozov, A., Heindl, T., Krücken, R., Ulrich, A., Wieser, J., J. Appl. Phys. 103, 103301 (2008) CrossRef
Morozov, A., Krücken, R., Ulrich, A., McCarthy, T., J. Chem. Phys. 123, 234311 (2005) CrossRef
McCarthy, T.J., Murnick, D.E., Salvermoser, M., Ulrich, A., J. Phys. B 38, 3043 (2005) CrossRef
Morozov, A., Krücken, R., Ottenthal, T., Ulrich, A., Wieser, J., Appl. Phys. Lett. 86, 011502 (2005) CrossRef
Morozov, A., Krylov, B., Gerasimov, G., Arnesen, A., Hallin, R., J. Phys. D 36, 1126 (2003) CrossRef
Efthimiopoulos, T., Zouridis, D., Ulrich, A., J. Phys. D 30, 1746 (1997) CrossRef
The Pierre Auger Collaboration, , Science 318, 938 (2007) CrossRef
Ave, M. et al., Astropart. Phys. 28, 41 (2007) CrossRef
Morozov, A., Krücken, R., Wieser, J., Ulrich, A., Eur. Phys. J. D 33, 207 (2005) CrossRef
Morozov, A., Heindl, T., Wieser, J., Krücken, R., Ulrich, A., Eur. Phys. J. D 46, 51 (2008) CrossRef
Orlovsky, V.M., Skakun, V.S., Tarasenko, V.F., Fedenev, A.V., Russ. Phys. J. 43, 372 (2000) CrossRef
Sethian, J.D. et al., IEEE Trans. Plasma Sci. 28, 1333 (2000) CrossRef
Sereda, O.V., Tarasenko, V.F., Fedenev, A.V., Sov. J. Quant. Electron. 21, 172 (1991) CrossRef
Ulrich, A., Nießl, C., Wieser, J., Tomizawa, H., Murnick, D.E., Salvermoser, M., J. Appl. Phys. 86, 3525 (1999) CrossRef
Ulrich, A., Wieser, J., Brunnhuber, A., Krötz, W., Appl. Phys. Lett. 64, 1902 (1994) CrossRef
Mühlberger, F., Streibel, T., Wieser, J., Ulrich, A., Zimmermann, R., Anal. Chem. 77, 7408 (2005) CrossRef
Mühlberger, F., Wieser, J., Morozov, A., Ulrich, A., Zimmermann, R., Anal. Chem. 77, 2218 (2005) CrossRef
Mühlberger, F., Wieser, J., Ulrich, A., Zimmermann, R., Anal. Chem. 74, 3790 (2002) CrossRef
T. Kappes, T. Hammer, A. Ulrich, International Application No.: PCT/DE2002/004641