Hostname: page-component-745bb68f8f-d8cs5 Total loading time: 0 Render date: 2025-01-12T21:01:20.462Z Has data issue: false hasContentIssue false
  • English
  • Français

Dual-wavelength laser heterodyne interferometer for absolute displacement measurement

Published online by Cambridge University Press:  23 March 2006

I. Naeim ,
M. Amer  and
M. Nicklawy
I. Naeim*
Affiliation:
National Institute of Standards, Giza, Egypt
M. Amer
Affiliation:
National Institute of Standards, Giza, Egypt
M. Nicklawy
Affiliation:
Helwan University, Faculty of Science, Egypt
*
[email protected]
Get access

Abstract

In order to meet absolute metrology of displacement in several axes simultaneously; the induced errors due to the fluctuation of atmospheric parameters and Doppler effect should be investigated. Measurements of phase dispersion and Doppler frequency shift over two different axes using dual-wavelength laser heterodyne interferometer (ZMI-1000A) are reported. The principle of this work is to study the induced parameters influences of an absolute measurement of a displacement over two different axes in a free atmosphere using laser heterodyne interferometer.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 34 , Issue 1 , April 2006 , pp. 67 - 70
Copyright
© EDP Sciences, 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Stone, J., Phillips, S.D., Mandolfo, G.A., J. Res. Inst. Stand. Technol. 101, 671 (1996) CrossRef
Nakatani, N., Opt. Rev. 6, 443 (1999) CrossRef
Cosijns, S.J.A.G. et al., Precis. Eng. 26, 448 (2002) CrossRef
ZMI-1000A Operating manual (ZYGO Corporation, Middlefield, 1999)
Bodroff, N., Meas. Sci. Technol. 4, 907 (1993) CrossRef
Weidong Zhou, Lilong Cai, , Meas. Sci. Technol. 9, 1647 (1998)
Ji-hua Zhang, Chia-Hsiang Menq, , Meas. Sci. Technol. 10, 1247 (1999)
Edlén, B., Metrologia 2, 71 (1966) CrossRef
Birch, Dowens, , Metrologia 30, 155 (1993)
Beers, J., Doiron, T., Metrologia 29, 315 (1992) CrossRef
Noh-Bin, Yim, Cheon ll Eom, Seung-Woo Kim, Meas. Sci. Technol. 11, 1131 (2000)
Ishida, A., Jpn J. Appl. Phys. 28, L473 (1989) CrossRef
Eom, I.J., Kim, K.C., Suh, H.S., Rev. Sci. Instrum. 68, 4612 (1997) CrossRef