Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-20T04:41:07.808Z Has data issue: false hasContentIssue false

Dielectric dispersion analysis of copolymer L-B thin film

Published online by Cambridge University Press:  30 January 2012

S.N. Al-Refaie
Affiliation:
Electronics Engineering Department, Hijjawi Faculty for Engineering Technology, Yarmouk University, Irbid 21163, Jordan
S.A. Alboon*
Affiliation:
Electronics Engineering Department, Hijjawi Faculty for Engineering Technology, Yarmouk University, Irbid 21163, Jordan
*
Get access

Abstract

The dielectric dispersion of copolymer ferroelectric Langmuir-Blodgett thin film has been subjected to investigation using multiple-arc methodology with the associated relaxation time distribution. The analysis made use of reported data over the frequency range 10 Hz–2 MHz and over the temperature range of 308–398 K. The analysis indicated the presence of two distinct polarization modes corresponding to high- and low-frequency arcs. The modes have different characterizations in terms of the relaxation spread and mean time trends with temperature. The trends of the low-frequency arc with temperature support ferroelectric property for the thin L-B film. Satisfactory agreements have been realized between the experimental data and those derived by multiple-arc approach.

Type
Research Article
Copyright
© EDP Sciences, 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Subramanyan, G., Keuls, F.V., Miranda, F.A., IEEE Microw. Guided Wave Lett. 8, 78 (1998)CrossRef
Lancaster, M.J., Powell, J., Porch, A., Supercond. Sci. Technol. 11, 1323 (1998)CrossRef
Gaynutdinov, R.V., Lysova, O.A., Tolstikhina, A.L., Yudin, S.G., Fridkin, V.M., Ducharme, S., Appl. Phys. Lett. 92, 172902 (2008)CrossRef
Bai, M., Sorokin, A.V., Thompson, D.W., Poulsen, M., Ducharme, S., Herzinger, S.M., Palto, S., Fridkin, V.M., Yadin, S.G., Savchenk, V.E., Gribova, L.K., J. Appl. Phys. 7, 3372 (2004)CrossRef
Schafer, H., Sternin, E., Stannarius, R., Arndt, M., Kremer, F., Phys. Rev. Lett. 76, 2177 (1996)CrossRef
Jonscher, A.K., J. Phys. D: Appl. Phys. 32, R57 (1999)CrossRef
Liu, P., Yao, X., Solid State Commun. 132, 809 (2004)CrossRef
Sundrakannan, B., Kakimoto, K., Ohsato, H., J. Appl. Phys. 94, 5182 (2003)CrossRef
Ang, C., Guo, R., Bhalla, S., Cross, L.E., J. Appl. Phys. 87, 7452 (2000)CrossRef
Jogad, M.S., Ducharme, S., Curr. Sci. 83, 472 (2002)
Al-Refaie, S.N., Appl. Phys. A 52, 234 (1991)CrossRef
Cole, K.S., Cole, R.H., J. Chem. Phys. 9, 341 (1941)CrossRef
Daniel, V.V., Dielectric Relaxation (Academic Press, 1967), Chap. 8Google Scholar
Pirc, R., Blinc, R., Phys. Rev. B 76, 020101 (2007)CrossRef
Choi, J., Borca, C.N., Dowben, P.A., Bune, A., Poulsen, M., Pebley, S., Adewalla, S., Ducharme, S., Phys. Rev. B 61, 5760 (2000)CrossRef
Al-Refaie, S.N., Elayyan, H.S.B., IET Sci. Meas. Tech. 1, 133 (2007)CrossRef
Daniel, V.V., Dielectric Relaxation (Academic Press, 1967), Chap. 16Google Scholar
Diosa, J.E., Vergas, R.A., Albinsson, I., Meller, B.E., Solid State Commun. 132, 55 (2004)CrossRef