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Characteristics ofPt/PbZr0.52Ti0.48O3/PtandAu/PbZr0.52Ti0.48O3/YBa2Cu3O7−δ capacitors after γ-ray irradiation

Published online by Cambridge University Press:  15 September 1999

J. Gao ,
L. Zheng ,
Z. Song ,
C. Lin  and
D. Zhu
J. Gao
Affiliation:
Shanghai Institute of Nuclear Research, the Chinese Academy of Sciences, Shanghai 201800, P.R. China State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, the Chinese Academy of Sciences, Shanghai 200050, P.R. China
L. Zheng
Affiliation:
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, the Chinese Academy of Sciences, Shanghai 200050, P.R. China
Z. Song
Affiliation:
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, the Chinese Academy of Sciences, Shanghai 200050, P.R. China
C. Lin
Affiliation:
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, the Chinese Academy of Sciences, Shanghai 200050, P.R. China
D. Zhu
Affiliation:
Shanghai Institute of Nuclear Research, the Chinese Academy of Sciences, Shanghai 201800, P.R. China
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Abstract

PbZr0.52Ti0.48O3 (PZT) and YBa2Cu3O7−δ (YBCO) thin filmswere fabricated by a pulsed laser deposition (PLD) method. The Pt/PZT/Pt ferroelectric capacitors were fabricated on silicon substrates while the Au/PZT/YBCO capacitors were fabricated on LaAlO3 substrates. The capacitance-voltage (C-V) propertiesand the hysteresis loops of the capacitors were measured before and after γ-rayirradiation. The results show that for Pt/PZT/Pt capacitors, the remanent polarizationP r and the absolute coercive field E C increase while the dielectricconstant ε decrease with increasing accumulated dose. For the Au/PZT/YBCOcapacitors, P r and ε decreased with accumulated dose, but theabsolute value of the negative and positive coercive fields increased. The resultshave been interpreted by radiation-induced positive charge trapping at defects in theferroelectric materials.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 8 , Issue 2 , September 1999 , pp. 105 - 109
Copyright
© EDP Sciences, 1999

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