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Capturing EELS in the reciprocal space

Published online by Cambridge University Press:  20 June 2011

C. Hébert*
Affiliation:
Institute of Condensed Matter Physics, École Polytechnique Fédérale de Lausanne, Switzerland Interdisciplinary Center for Electron Microscopy, École Polytechnique Fédérale Lausanne, Switzerland
A. Alkauskas
Affiliation:
Institute of Condensed Matter Physics, École Polytechnique Fédérale de Lausanne, Switzerland Interdisciplinary Center for Electron Microscopy, École Polytechnique Fédérale Lausanne, Switzerland
S. Löffler
Affiliation:
Institute of Solid State Physics, Vienna University of Technology, Austria
B. Jouffrey
Affiliation:
LMSS-Mat, CNRS-UMR 8579, École Centrale Paris, Châtenay-Malabry, France
P. Schattschneider
Affiliation:
LMSS-Mat, CNRS-UMR 8579, École Centrale Paris, Châtenay-Malabry, France University Service Centre for Transmission Electron Microscopy, Vienna University of Technology, Austria

Abstract

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In this work two aspects of momentum-dependent electron energy loss spectrometry are studied,both in the core-loss and in the low-loss region. In the case of core losses, we focus on the demonstration andthe interpretation of an unexpected non-Lorentzian behavior in the angular part of the double-differentialscattering cross-section. The silicon L3 edge is taken as an example. Using calculations we show that thenon-Lorentzian behavior is due to a change in the wavefunction overlap between the initial and the finalstates. In the case of low losses, we first analyze the momentum-dependent loss functions of coinage metalsCu, Ag, and Au. We then demonstrate how advanced electronic structure calculations can be used tobuild simple models for the dielectric function that can then serve as a basis for the calculation of morecomplicated sample geometries.

Type
Research Article
Copyright
© EDP Sciences, 2011

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