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Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction
Published online by Cambridge University Press: 03 October 2003
Abstract
We use High Resolution Electron Microscopy (HRTEM)together with Electron Energy Loss Spectroscopy (EELS) to analyzethe crystallography and the chemical configuration of interfacesin a state-of-the-artLa2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3tunnel junction. EELS indicates that manganese ions keep theirbulk valency up to the last atomic plane in contact with theinsulator. Tunnel magnetoresistance however decreases withtemperature faster than magnetisation in these samples.Quantitative HRTEM reveals some local departures from chemicalabruptness at the interfaces, which could play a role in thisdecrease.
- Type
- Research Article
- Information
- The European Physical Journal - Applied Physics , Volume 24 , Issue 3 , December 2003 , pp. 215 - 221
- Copyright
- © EDP Sciences, 2003
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