Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Bao, Tianming
Fong, David
and
Hand, Sean
2008.
Applied Scanning Probe Methods X.
p.
359.
Oliver, Rachel A
2008.
Advances in AFM for the electrical characterization of semiconductors.
Reports on Progress in Physics,
Vol. 71,
Issue. 7,
p.
076501.
Fleming, A.J.
Kenton, B.J.
and
Leang, K.K.
2010.
Bridging the gap between conventional and video-speed scanning probe microscopes.
Ultramicroscopy,
Vol. 110,
Issue. 9,
p.
1205.
Fleming, Andrew J.
2011.
Dual-Stage Vertical Feedback for High-Speed Scanning Probe Microscopy.
IEEE Transactions on Control Systems Technology,
Vol. 19,
Issue. 1,
p.
156.
Fairbairn, M. W.
and
Moheimani, S. O. R.
2012.
A Switched Gain Resonant Controller to Minimize Image Artifacts in Intermittent Contact Mode Atomic Force Microscopy.
IEEE Transactions on Nanotechnology,
Vol. 11,
Issue. 6,
p.
1126.
Fleming, Andrew J.
2013.
A review of nanometer resolution position sensors: Operation and performance.
Sensors and Actuators A: Physical,
Vol. 190,
Issue. ,
p.
106.
Fairbairn, Matthew W.
and
Moheimani, S.O. Reza
2013.
A New Approach to Active Q Control of an Atomic Force Microscope Micro-cantilever Operating in Tapping Mode.
IFAC Proceedings Volumes,
Vol. 46,
Issue. 5,
p.
368.
Fairbairn, Matthew W.
Muller, Philipp
and
Moheimani, S. O. Reza
2013.
Active piezoelectric shunt control of an Atomic Force Microscope micro-cantilever.
p.
257.
2013.
Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging.
IEEE Control Systems,
Vol. 33,
Issue. 6,
p.
46.
Fleming, Andrew J.
and
Leang, Kam K.
2013.
An experimental comparison of PI, inversion, and damping control for high performance nanopositioning.
p.
6027.
Fairbairn, Matthew W.
Muller, Philipp
and
Moheimani, S. O. Reza
2014.
Sensorless Implementation of a PPF Controller for Active <inline-formula> <tex-math notation="TeX">$Q$ </tex-math></inline-formula> Control of an AFM Microcantilever.
IEEE Transactions on Control Systems Technology,
Vol. 22,
Issue. 6,
p.
2118.
Fleming, Andrew J.
and
Leang, Kam K.
2014.
Design, Modeling and Control of Nanopositioning Systems.
p.
103.
Wang, Hongjin
Hsieh, Sheng-Jen
Zhou, Xunfei
Peng, Bo
and
Singh, Bhavana
2015.
Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering.
NDT & E International,
Vol. 76,
Issue. ,
p.
66.
Herfst, Rodolf
Dekker, Bert
Witvoet, Gert
Crowcombe, Will
de Lange, Dorus
and
Sadeghian, Hamed
2015.
A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.
Review of Scientific Instruments,
Vol. 86,
Issue. 11,
Sadeghian, Hamed
Herfst, Rodolf
Winters, Jasper
Crowcombe, Will
Kramer, Geerten
van den Dool, Teun
and
van Es, Maarten H.
2015.
Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection.
Review of Scientific Instruments,
Vol. 86,
Issue. 11,
Fleming, Andrew J.
and
Leang, Kam K.
2016.
Nanopositioning Technologies.
p.
245.
Payton, O. D.
Picco, L.
and
Scott, T. B.
2016.
High-speed atomic force microscopy for materials science.
International Materials Reviews,
Vol. 61,
Issue. 8,
p.
473.
Yong, Yuen Kuan
and
Leang, Kam K.
2016.
Nanopositioning Technologies.
p.
61.
Zalameda, Joseph N.
Bison, Paolo
Zhou, Xunfei
Wang, Hongjin
and
Hsieh, Sheng-Jen (Tony)
2016.
Thermography and k-means clustering methods for anti-reflective coating film inspection: scratch and bubble defects.
Vol. 9861,
Issue. ,
p.
98610S.
Zhang, Jing
Song, Hong-Lian
Qiao, Mei
Yu, Xiao-Fei
Wang, Tie-Jun
and
Wang, Xue-Lin
2017.
The effects on γ -LiAlO 2 induced by nuclear energy losses during Ga ions implantation.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 406,
Issue. ,
p.
624.