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AFM and XRD studies of GaAs surface after anisotropic etching

Published online by Cambridge University Press:  15 July 2004

N. L. Dmitruk ,
V. P. Kladko ,
R. V. Konakova  and
A. V. Karimov
N. L. Dmitruk*
Affiliation:
Institute for Physics of Semiconductors of the National Academy of Sciences of Ukraine, 45 Prospect Nauki, 03028, Kyiv-28, Ukraine
V. P. Kladko
Affiliation:
Institute for Physics of Semiconductors of the National Academy of Sciences of Ukraine, 45 Prospect Nauki, 03028, Kyiv-28, Ukraine
R. V. Konakova
Affiliation:
Institute for Physics of Semiconductors of the National Academy of Sciences of Ukraine, 45 Prospect Nauki, 03028, Kyiv-28, Ukraine
A. V. Karimov
Affiliation:
Physical-Technical Institute of the Scientific Association “Physics-Sun” of the Academy of Sciences of Republic of Uzbekistan, Tashkent, Uzbekistan
*
[email protected]
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Abstract

A technology of anisotropic etching of GaAs (100) samples with two different types of geometric disorder (dendrite, quasi-grating) has been elaborated. The geometric statistical parameters of micro(nano)relief were investigated using bearing analysis. The measurements of the radii of curvature have shown that the samples were rather deformed, with nonuniform strain lateral distribution over the wafer areas. The radii of curvature were different for different samples, depending on surface treatment. The X-ray diffraction data indicate that the subsurface region of anisotropically etched GaAs crystal and epitaxial films grown on such substrates are not worse than those of a crystal with smooth chemically polished surface. Geometric disorder of such surfaces leads to enhancement of the diffuse contributions on the rocking curve tails.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 27 , Issue 1-3: Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X) , July 2004 , pp. 407 - 409
Copyright
© EDP Sciences, 2004

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References

Dmitruk, I., Dmitruk, N., Domagala, J., Klinger, D., Zymierska, D., Auleytner, J., J. Alloys and Comp. 289, 289 (1999) CrossRef
Afanas'ev, A. M., Chuyev, M. A., Imamov, R. M., Lomov, A. A., Mokerov, V. G., Fedorov, Yu. V., Guk, A. V., Kristallografiya 42, 514 (1997) (in Russian)
L. I. Datsenko, V. P. Kladko, V. F. Machulin, V. B. Molodkin, X-ray Dynamic Scattering by Actual Crystals in the Anomalous Dispersion Region (Akademperiodika, Kiev, 2002) (in Russian)
V. Holy, U. Pietch, T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer, Berlin, 1998)
De Caro, L., Sciacovelli, P., Tapfer, L., Appl. Phys. Lett. 64, 34 (1994) CrossRef
Krost, A., Blasing, J., Heinrichsdorf, F., Bimberg, D., Appl. Phys. Lett. 75, 2957 (1999) CrossRef