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Sub-wavelength surface IR imaging of soft-condensed matter
Published online by Cambridge University Press: 07 July 2010
Abstract
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
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- © EDP Sciences, 2010
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