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Spectroscopic study of resonant dielectric structures in near-field*

Published online by Cambridge University Press:  15 March 1999

S. Davy ,
D. Barchiesi ,
M. Spajer  and
D. Courjon
S. Davy
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
D. Barchiesi*
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
M. Spajer
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
D. Courjon
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
*
[email protected]
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Abstract

Gratings can be considered as resonant structures in near-field.The enhancement of the intensity recorded by Scanning Near-FieldOptical Microscopes (SNOM) is due to interferences in relation with the ratio ofthe wavelength to the product of the optical index by the period of thegrating. We discuss the effect of this ratio (in the range 0.9, 1.1) on theintensity patterns. The influence of the polarization on near-field data isanalyzed in both theoretical computations and experimental result.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 5 , Issue 3 , March 1999 , pp. 277 - 281
Copyright
© EDP Sciences, 1999

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Footnotes

*

This paper was presented at the specialCFMCP colloquium held at Strasbourg-Illkirch the July 1st-3rd, 1998.

References

Harootunian, A., Betzig, E., Isaacson, M., Lewis, A., Appl. Phys. Lett. 49, 674 (1986). CrossRef
Meixner, A., Zeisel, D., Boop, M.A., Tarrach, G., Opt. Eng. 34, 2324 (1995). CrossRef
Chang, R., Fann, W., Lin, H., Appl. Phys. Lett. 69, 2338 (1996). CrossRef
Pagnot, T., Barchiesi, D., van Labeke, D., Pieralli, C., Opt. Lett. 22, 120 (1997). CrossRef
Courjon, D., Vigoureux, J.M., Spajer, M., Sarayeddine, K., Leblanc, S., Appl. Opt. 29, 3734 (1990). CrossRef
Betzig, E., Finn, P.L., Weiner, J.S., Appl. Phys. Lett. 60, 2484 (1992). CrossRef
Barchiesi, D., Bergossi, O., Spajer, M., Pieralli, Ch., Ultramicroscopy 71, 361 (1998). CrossRef
Barchiesi, D., Opt. Commun. 126, 7 (1996). CrossRef
Barchiesi, D., Girard, Ch., Martin, O.J.F., van Labeke, D., Courjon, D., Phys. Rev. E 54, 4285 (1996). CrossRef
Popov, E., Mashev, L., Optica Acta 33, 593 (1986). CrossRef
Sentenac, A., Greffet, J.J., Pincemin, F., J. Opt. Soc. Am. B 14, 339 (1997). CrossRef