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Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra

Published online by Cambridge University Press:  30 April 2008

M. R. Nenkov  and
T. G. Pencheva
M. R. Nenkov*
Affiliation:
University of Rousse, Physics Department, 7017 Rousse, Bulgaria
T. G. Pencheva
Affiliation:
University of Rousse, Physics Department, 7017 Rousse, Bulgaria
*
[email protected]
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Abstract

A novel approach for determination of refractive index dispersion n(λ) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate and titanium oxide thin films are investigated and their n(λ) and d are calculated. The approach is validated using Swanepoel's method and it is found to be applicable for relatively thinner films when measured transmittance spectra have one minimum and one maximum only.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 42 , Issue 3 , June 2008 , pp. 219 - 228
Copyright
© EDP Sciences, 2008

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