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Microstructure and morphology evolution in chemically deposited semiconductor films: 4. From isolated nanoparticles to monocrystalline PbS thin films on GaAs(100) substrates

Published online by Cambridge University Press:  13 December 2006

A. Osherov
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
V. Ezersky
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
Y. Golan*
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
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Abstract

Thin lead sulfide films were grown on single crystal GaAs(100) substrates by chemical deposition using Pb(NO3)2 and CS(NH2)2 with excess of NaOH in aqueous solution at a range of deposition temperatures 0–50 °C. The microstructure and morphology evolution were studied as a function of the deposition conditions, resulting in a wide range of microstructures. Ultrahigh resolution scanning electron microscopy and atomic force microscopy indicated a systematic change in particle shape and surface morphology as a function of deposition temperature and deposition time. X-ray diffraction of 200–500 nm thick films indicated a dominant $\langle 110\rangle$ texture throughout the deposition temperature range. At deposition temperatures above 40 °C, single crystal films were obtained. Cross-sectional transmission electron microscopy analyses showed a unique (011)PbS||(100)GaAs and [100]PbS||[011]GaAs orientation relationship.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2006

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