Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-25T16:50:36.286Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstrip ring resonators applied to ferrite material (YIG) characterization in microwave frequency bands

Published online by Cambridge University Press:  20 August 2014

Amel Tanto ,
Didier Vincent  and
Abdelhamid Chergui
Amel Tanto
Affiliation:
Faculté des sciences, Département de physique, Université setif 1, Setif 19000, Algeria
Didier Vincent*
Affiliation:
Université de Lyon, 42023 Saint-Etienne, France Université de Saint-Etienne, Jean Monnet, 42000 Saint-Etienne, France LT2C, 42000 Saint-Etienne, France
Abdelhamid Chergui
Affiliation:
Faculté des sciences, Département de physique, Université setif 1, Setif 19000, Algeria
*
a e-mail: [email protected]
Get access

Abstract

Microstrip ring resonator (MSRR) is an efficient technique for electromagnetic material characterization in microwave bands. Ferrites constitute important class of materials for microwave devices, especially for RF passive components. The aim of the work was to characterize ferrite materials using the frequency response of MSRRs. A theoretical analysis of the problem has been developed to find a relation between the ring resonance frequencies and the electromagnetic properties of ferrite such as effective permittivity and permeability. The measurements made on YIG (101) from 1 to 30 GHz are found to be in good agreement with the theoretical results. And the MSRR technique applied on ferrite materials has been validated.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 67 , Issue 3 , August 2014 , 30601
Copyright
© EDP Sciences, 2014

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Chang, K., Hsieh, L.-H., Microwave Ring Circuits and Related Structures (John Wiley & Sons Inc., Hoboken New Jersey, 2004)CrossRefGoogle Scholar
Hopkins, R., Influence of radiation losses in microstrip ring resonators used for materials characterization, in IMAPS 39th International symposium on Microelectronics, San Diego, California, USA, 2006Google Scholar
Samanta, K.K., Stephens, D., Robertson, I.D., Ultrawide-band characterisation of photoimageable thick film materials for microwave and millimeter-wave design in IEEE MTT-S Int. Microwave Symp. Digest, Long Beach, California, USA, 2005Google Scholar
Hopkins, R., IET Microw. Antennas Propag. 2, 66 (2008)CrossRef
Thompson, D.C., Tantot, O., Jallageas, H., Ponchak, G.E., Tentzeris, M.M., Papapolymerou, J., IEEE Trans. Microwave Theor. Tech. 52, 1343 (2004)CrossRef
Kulke, R., Simon, W., Investigation of ring-resonators on multilayers LTCC, in Workshop on Ceramic Interconnect Technologies, IMS, Phoenix, Arizona, 2001Google Scholar
Heinola, J.-M., Lätti, K.-P., Silventoinen, P., Ström, J.-P., Kettunen, M., in Proceedings of the International Symposium and Exhibition on Advanced Packaging Materials Processes, Properties and Interfaces, vol. 9 (IEEE Components Packaging and Manufacturing Technology, Atlanta, Georgia, USA, 2004), pp. 235–240Google Scholar
Gelin, P., Berthou-Pichavant, K., IEEE Trans. Microwave Theor. Tech. 45, 1185 (1997)CrossRef
Lezaca, J., Queffelec, P., Chevalier, A., Méthode de Caractérisation Electromagnétique In Situ et Large Bande des Ferrites Anisotropes pour l’Aide à la Conception de Circulateurs (16# Journées Nationales Microondes, Grenoble, 2009).Google Scholar
Vincent, D., Rouiller, Th., Simovsky, C., Bayard, B., Noyel, G. IEEE Trans. Microwave Theor. Tech. 53, 1174 (2005)CrossRef
Troughton, P., Electron. Lett. 5, 25 (1969)CrossRef
Polder, D., Philos. Mag. 40, 99 (1949)CrossRef
Kompa, G., Mehran, R., Electron. Lett. 11, 459 (1975)CrossRef
Hammerstad, E., Jensen, O., Accurate Models for Microstrip Computer Aided Design (IEEE MTT-S International Microwave Symposium Digest, Washington, 1980), pp. 407–409Google Scholar
Kirschning, M., Jansen, R.H., Electron. Lett. 18, 272 (1982)CrossRef
Quéffélec, P., Le Floc’h, M., Gelin, P., IEEE Trans. Instrum. Meas. 47, 956 (1998)CrossRef
Wen, C.P., IEEE Trans. Microwave Theor. Tech. MTT-17, 1087 (1969).CrossRef
Aharonia, A., J. Appl. Phys. 83, 3432 (1998)CrossRef
Tsutsumi, M., Asahara, T., IEEE Trans. Microwave Theor. Tech. 38, 1461 (1990)CrossRef