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Measurement of in-plane displacement fields by a spectral phase algorithmapplied to numerical speckle photographfor microtensile tests

Published online by Cambridge University Press:  15 August 2000

C. Poilane ,
E. Lantz ,
G. Tribillon  and
P. Delobelle
C. Poilane
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR CNRS 6603 and IMFC, FRW 0067), Université de Franche-Comté, UFR Sciences et Techniques, route de Gray, La Bouloie, 25000 Besançon, France Laboratoire de Mécanique Appliquée R. Chaléat (UMR CNRS 6604 and IMFC, FRW 007), Université de Franche-Comté, UFR Sciences et Techniques, 24 rue de l'Épitaphe, 25000 Besançon, France
E. Lantz
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR CNRS 6603 and IMFC, FRW 0067), Université de Franche-Comté, UFR Sciences et Techniques, route de Gray, La Bouloie, 25000 Besançon, France
G. Tribillon
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR CNRS 6603 and IMFC, FRW 0067), Université de Franche-Comté, UFR Sciences et Techniques, route de Gray, La Bouloie, 25000 Besançon, France
P. Delobelle*
Affiliation:
Laboratoire de Mécanique Appliquée R. Chaléat (UMR CNRS 6604 and IMFC, FRW 007), Université de Franche-Comté, UFR Sciences et Techniques, 24 rue de l'Épitaphe, 25000 Besançon, France
*
[email protected]
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Abstract

This paper describes a numerical method applied to speckle photography to measure the in- plane displacement field on a thin film and specially adapted to microtensile test. Speckle photography is chosen to avoid touching and stressing the specimen. A Spectral Phase Algorithm particularly useful in the case of small displacement or/and strain is compared with the Intercorrelation and Double FFT methods. A final algorithm using first the Intercorrelation method without interpolation and secondly the Spectral Phase Algorithm is then adopted to estimate with good accuracy the in-plane displacement field in quasi-real time during the microtensile tests.

A first application of the method to the tensile tests performed on thin films of electroplated copper of 18, 35 and 70 μm of thickness is then presented.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 11 , Issue 2 , August 2000 , pp. 131 - 145
Copyright
© EDP Sciences, 2000

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