Published online by Cambridge University Press: 15 July 2004
It is interesting to consider the problem of the presence of
defects in the semiconductor binary compounds by observing their
elemental tetrahedron distortions, caused by the creation of
vacancies and interstitial atoms within the tetrahedra and so
on. Our model thus considers the system A(VzxZ$_{1-x}$) and
(A$_{1-y}$
Vay)Z as composed of five defect tetrahedron
configurations where A is a cation atom, Z an anion atom, Va-cation
vacancy, Vz-anion vacancy. In this communication we present far
IR (FIR) spectra obtained at the DAFNE facility of Laboratori
Nazionali di Frascati (INFN) using
its synchrotron radiation. Two samples of CdTe are considered:
sample-1 was grown by the PVT technique and sample-2 using
the same technique but on the basis of, polycrystalline CdTe
previously purified from oxygen in hydrogen atmosphere.