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High-frequency characterization and modeling of single metallic nanowires*

Published online by Cambridge University Press:  05 July 2013

Chuan-Lun Hsu ,
Gustavo Ardila  and
Philippe Benech
Chuan-Lun Hsu
Affiliation:
IMEP-LAHC, Grenoble-INP, UJF, CNRS, US, 3 Parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France
Gustavo Ardila
Affiliation:
IMEP-LAHC, Grenoble-INP, UJF, CNRS, US, 3 Parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France
Philippe Benech*
Affiliation:
IMEP-LAHC, Grenoble-INP, UJF, CNRS, US, 3 Parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France
*
a e-mail: [email protected]
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Abstract

The transmission line characteristics of an individual aluminum metallic nanowire up to 100 GHz are presented in this paper. We have built a reliable framework for characterizing such nanowires using a specially designed coplanar waveguide platform. We systematically estimate the pad parasitics, contact impedance and transmission line parameters based on an equivalent circuit model and cascade-based de-embedding theory. This is the first time that such external parasitic elements have been successfully removed from a nanoscale transmission line. The extracted frequency-dependent electrical responses show good signal levels and a high degree of reproducibility.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 63 , Issue 1: International Semiconductor Conference Dresden-Grenoble – ISCDG 2012 , July 2013 , 14406
Copyright
© EDP Sciences, 2013

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Footnotes

*

Contribution to the Topical Issue “International Semiconductor Conference Dresden-Grenoble – ISCDG 2012”, Edited by Gérard Ghibaudo, Francis Balestra and Simon Deleonibus.

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