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High frequency model of stacked film capacitors

Published online by Cambridge University Press:  15 November 2001

T. Talbert ,
C. Joubert ,
N. Daude  and
C. Glaize
T. Talbert*
Affiliation:
Laboratoire d'Électrotechnique de Montpellier, Université de Montpellier II, place Eugène Bataillon, CC 079, 34095 Montpellier Cedex 5, France
C. Joubert
Affiliation:
Laboratoire d'Électrotechnique de Montpellier, Université de Montpellier II, place Eugène Bataillon, CC 079, 34095 Montpellier Cedex 5, France
N. Daude
Affiliation:
Laboratoire d'Électrotechnique de Montpellier, Université de Montpellier II, place Eugène Bataillon, CC 079, 34095 Montpellier Cedex 5, France
C. Glaize
Affiliation:
Laboratoire d'Électrotechnique de Montpellier, Université de Montpellier II, place Eugène Bataillon, CC 079, 34095 Montpellier Cedex 5, France
*
[email protected][email protected][email protected][email protected]
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Abstract

Polypropylene metallized capacitors are of general use in power electronics because of their reliability, their self-healing capabilities, and their low price. Though the behavior of metallized coiled capacitors has been discussed, no work has been carried out on stacked and flattened metallized capacitors. The purpose of this article is to suggest an analytical model of resonance frequency, stray inductance and impedance of stacked capacitors. We first solve the equation of propagation of the magnetic potential vector (A) in the dielectric of an homogeneous material. Then, we suggest an original method of resolution, like the one used for resonant cavities, in order to present an analytical solution of the problem. Finally, we give some experimental results proving that the physical knowledge of the parameters of the capacitor (dimension of the component, and material constants), enables us to calculate an analytical model of resonance frequency, stray inductance and impedance of stacked capacitors.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 16 , Issue 2 , November 2001 , pp. 105 - 112
Copyright
© EDP Sciences, 2001

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