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Fabrication, morphology and photoluminescence propertiesof GaN nanowires

Published online by Cambridge University Press:  13 June 2007

Huizhao Zhuang*
Affiliation:
Institute of Semiconductors, Shandong Normal University, Jinan 250014, P.R. China
Shoubin Xue
Affiliation:
Institute of Semiconductors, Shandong Normal University, Jinan 250014, P.R. China
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Abstract

GaN nanowires were successfully synthesized on Si(111) substrates by ammoniating the Ga2O3/ZnO films at 900 °C. The structure, morphology and optical property of the as-prepared GaN nanowires were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), field-emission transmission electron microscope (FETEM), Fourier transform infrared spectrum (FTIR) and fluorescence spectrophotometer. The results show that the GaN nanowires have a hexagonal wurtzite structure with lengths of about several micrometers and diameters ranging from 30 nm to 120 nm. The representative photoluminescence spectrum at room temperature exhibited a strong emission peak at 374.1 nm and two weak emission peaks at 437.4 nm and 473.3 nm. Finally, the growth mechanism is also briefly discussed.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2007

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References

Morales, A.M., Lieber, C.M., Science 279, 208 (1998) CrossRef
Huang, Y., Duan, X., Cui, Y., Lieber, C.M., Nano Lett. 2, 101 (2002) CrossRef
Gansalvaes, K.E., Carlson, G., Rangarajan, S.P., Benaissa, M., Joseyacaman, M., J. Mater. Chem. 6, 1451 (1996) CrossRef
Yamane, H., Shimada, M., Clarke, S.J., Disalvo, F.J., Chem. Mater. 9, 413 (1997) CrossRef
Huang, Y., Duan, X., Cui, Y., Lauhon, L.J., Kim, K.H., Science 294, 1313 (2001) CrossRef
Kim, J.R. et al., Appl. Phys. Lett. 80, 3548 (2002) CrossRef
Han, W.Q., Redlich, P., Ernst, F., Ruhle, M., Appl. Phys. Lett. 76, 652 (2000) CrossRef
Han, W.Q., Zett, A., Appl. Phys. Lett. 80, 303 (2002) CrossRef
Duan, X.F., Lieber, C.M., J. Am. Chem. Soc. 122, 188 (2002) CrossRef
Perlin, P., Jauberthiecarillon, C., Itie, J.P., Miguel, A.S., Grzegory, I., Polian, A., Phys. Rev. B 45, 83 (1992) CrossRef
Goldberger, J., He, R., Zhang, Y.F., Lee, S.K., Yan, H.Q., Yang, P.D., Nature 422, 599 (2003) CrossRef
Masanobu Futsuhara, Katsuaki Yoshioka, Osamu Takai, Thin Solid Films 322, 274 (1998 )
Yang, yingge et al., Appl. Surf. Sci. 193, 254 (2002) CrossRef
Li, Yang et al., Int. J. Mod. Phys. 46, 1639 (2002)
Sun, Yong, Miyasato J, Tatsuro, Wigmore, Keith, J. Appl. Phys. 85, 3377 (1999) CrossRef
Meng, G.W., Zhang, L.D., Qin, Y., Mo, C.M., Phillipp, F., Nanostruct. Mater. 12, 1003 (1999) CrossRef
Bachari, E.M. et al., Thin Solid Film 348, 165 (1999) CrossRef
Xiao Hongdi, et al., Diamond Related Mater. 14, 1730 (2005) CrossRef
B.K. Ridley, in Quantum Process in Semiconductors (Clarendon, Oxford, 1982), pp. 62–66
Monemar, B., Phys. Rev. B 10, 676 (1974) CrossRef
Xiaojun Mao, Zhijian, Yang, Chin. J. Sem. 20, 639 (1999)
Y. Sun, T. Miyasato, J. Appl. Phys. 84, (1998) 6451
Xiaolong Chen, et al., Adv. Mater. 12, 1432 (2000) 3.0.CO;2-X>CrossRef
W.S. Shi et al. Chem. Phys. Lett. 345, 377 (2001)
Peng, H.Y. et al., Chem. Phys. Lett. 327, 263 (2000) CrossRef
Shoubin Xue, Huizhao Zhuang, Chengshan Xue Lijun Hu, J. Electron. Mat. (2006, accepted)
Chengshan Xue, et al., Physica E 30, 179 (2005)