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Evidence of strain induced structural change in hetero-epitaxial NdNiO3 thin films with metal-insulator transition

Published online by Cambridge University Press:  02 December 2003

P. Laffez ,
O. I. Lebedev ,
P. Ruello ,
R. Desfeux ,
G. Banerjee  and
F. Capon
P. Laffez*
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
O. I. Lebedev
Affiliation:
EMAT, University of Antwerp, Groeonenborgerlaan 171, 2020 Antwerp, Belgium
P. Ruello
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
R. Desfeux
Affiliation:
Laboratoire de Physico-Chimie des Interfaces et Applications, Université d'Artois, rue Jean Souvraz, SP 18, 62307 Lens Cedex, France
G. Banerjee
Affiliation:
Exp. Cond. Matter Physics Division, Saha Institute of Nuclear Physics 1/AF Bidhan Nagar, Calcutta 700064, India
F. Capon
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
*
[email protected]
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Abstract

Neodymium nickelate thin films have been prepared on NdGaO3 substrates by RF magnetron sputtering and post-annealing treatment under oxygen pressure. Transport properties are found to depend strongly on film thickness. Thick films show transport properties close to bulk ceramics, while very thin films exhibit a large transition from metal to insulator which occurs over a wide temperature range with high resistivity. Structure and surface morphology of the films have been investigated by Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). Thin films (≈17 nm) grow heteroepitaxially, while thicker films (≈73 nm) show a granular structure. The thinnest sample suggests a symmetry change induced by the epitaxial strain of the substrate. This paper discusses the relationship between microstructure and transport properties.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 25 , Issue 1 , January 2004 , pp. 25 - 31
Copyright
© EDP Sciences, 2004

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