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Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

Published online by Cambridge University Press:  27 March 2009

O. Werzer ,
B. Stadlober ,
A. Haase ,
H.-G. Flesch  and
R. Resel
O. Werzer*
Affiliation:
Institute of Solid State Physics, Graz University of Technology, Graz, Austria
B. Stadlober
Affiliation:
Institute of Nanostructured Materials and Photonics, Joanneum Research Forschungsgesellschaft mbH, Weiz, Austria
A. Haase
Affiliation:
Institute of Nanostructured Materials and Photonics, Joanneum Research Forschungsgesellschaft mbH, Weiz, Austria
H.-G. Flesch
Affiliation:
Institute of Solid State Physics, Graz University of Technology, Graz, Austria
R. Resel
Affiliation:
Institute of Solid State Physics, Graz University of Technology, Graz, Austria
*
[email protected]
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Abstract

The structural investigations of model organic systemslike pentacene on silicon oxide in the monolayer regime is veryimportant for the basic understanding of initial nucleation processtogether with the electronic performance of transistor devices. Amethod for the evaluation of the island formation and layer closingof the first monolayer is introduced. The method is based onspecular X-ray reflectivity and diffuse scattering and revealintegral information on the coverage together with the size andseparation of pentacene islands. The results are in good agreementwith AFM investigation that encourages the use of this type ofinvestigation in in-situ experiments.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 46 , Issue 2 , May 2009 , 20403
Copyright
© EDP Sciences, 2009

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