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The estimation of size and position of contaminating particle adhering to the insulating spacer surface in gas-insulated systems

Published online by Cambridge University Press:  22 May 2013

Yasin Khan ,
Firmansiah Nur Budiman ,
Abderrahmane Béroual ,
Nazar Hussain Malik  and
Abdulrehman Ali Al-Arainy
Yasin Khan
Affiliation:
Electrical Engineering Department, King Saud University, Riyadh, Saudi Arabia
Firmansiah Nur Budiman
Affiliation:
Electrical Engineering Department, King Saud University, Riyadh, Saudi Arabia
Abderrahmane Béroual*
Affiliation:
École Centrale de Lyon, University of Lyon, AMPERE Laboratory CNRS UMR 5005, 36 avenue Guy de Collongue, Ecully, France Visiting Professor at Saudi Aramco Chair in Electrical Power, King Saud University, Riyadh, Saudi Arabia
Nazar Hussain Malik
Affiliation:
Electrical Engineering Department, King Saud University, Riyadh, Saudi Arabia
Abdulrehman Ali Al-Arainy
Affiliation:
Electrical Engineering Department, King Saud University, Riyadh, Saudi Arabia
*
a e-mail: [email protected]
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Abstract

The presence of metallic particles has been recognized as a dangerous threat in gas-insulated substation (GIS). Such particles are initially free and move toward higher electric field regions such as triple junction i.e., spacer-electrode-gas interface. However, once these particles reach the spacer surface, they adhere to the spacer easily due to electrostatic image forces. From insulation point of view, the triple junction is the weakest point in GIS. The presence of such metallic particles on the spacer surface deteriorates the insulation strength. Thus, in order to improve the reliability of GIS, it is important to identify the size and the position of the particle adhering to the insulating spacer surface. One of the most promising methods to carry out such identification is by recognizing the partial discharges (PDs) provoked by such particles. This paper is aimed to discuss the particle size and position estimation by using the PD patterns and statistical analysis. The PD patterns were acquired using IEC 60270 method. Measurements were made to determine various PD signals caused by particle of different sizes at different locations on the spacer surface. The acquired PD patterns were characterized by a number of statistical parameters. The results show that the implemented technique could be used to distinguish between various particle sizes and positions at different SF6 pressures with a fairly high accuracy.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 62 , Issue 2 , May 2013 , 20801
Copyright
© EDP Sciences, 2013

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References

Anis, H., in High Voltage Engineering: Theory and Practice, edited by Khalifa, M. (Marcel Dekker, Inc., New York, NY, 1990), pp. 243–273Google Scholar
Bolin, P., in Electric Power Substations Engineering, edited by McDonald, J.D. (Taylor & Francis Group, LLC, Boca Raton, FL, 2007)Google Scholar
Jain, H.S., in Handbook of Switchgears, edited by Limited, B.H.E. (McGraw-Hill, New York, NY, 2007)Google Scholar
Morcos, M.M. et al., IEEE Electr. Insul. Mag. 16, 25 (2000)CrossRef
Okubo, H. et al., Partial discharge detection techniques under the condition of metallic particle adhering to solid spacer in SF6, Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Qu´ebec City, Canada, 2008, pp. 395–399Google Scholar
Kanako, N. et al., Particle size identification in GIS by ultra high speed measurement of partial discharge, International Conference on Condition Monitoring and Diagnosis (CMD), Beijing, China, 2008, pp. 443–447Google Scholar
Hayakawa, N. et al., Dependence of partial discharge characteristics at spacer surface on particle size in SF6 gas insulated system, International Conference on Condition Monitoring and Diagnosis (CMD), Beijing, China, 2008, pp. 46–50Google Scholar
Negara, Y. et al., IEEE Trans. Dielectr. Electr. Insul. 14, 91 (2007)CrossRef
Sahoo, N.C., Salama, M.M.A., Bartnikas, R., IEEE Trans. Dielectr. Electr. Insul. 12, 248 (2005)CrossRef
Kreuger, F.H., Gulski, E., Krivda, A., IEEE Trans. Electr. Insul. 28, 917 (1993)CrossRef
Jin, J. et al., IEEE Proc. Sci. Meas. Technol. 153, 55 (2006)CrossRef
Ziomek, W., Reformat, M., Kuffel, E., IEEE Trans. Dielectr. Electr. Insul. 7, 161 (2000)CrossRef
Koo, J.Y. et al., IET Sci. Meas. Technol. 4, 115 (2010)CrossRef
Gulski, E., Morshuis, P.H.F., Kreuger, F.H., Jpn J. Appl. Phys. 29, 1329 (1990)CrossRef
Mansor, M., Ghosh, P.S., Ghani, A.B.A., Int. J. Res. Rev. Appl. Sci. 5, 171 (2010)