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Effect of spray solution flow rate on the physical properties of CuInS2

Published online by Cambridge University Press:  11 June 2013

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Abstract

CuInS2 thin films have been successfully prepared on Pyrex substrates using spray pyrolysis technique. In this work, we study the effect of the flow rate on the physical properties of CuInS2 thin films. X-ray diffraction pattern reveals the presence of tetragonal structure with (1 1 2) preferential orientation for CIS thin layers. Optical analysis by means of transmission T(λ) and reflection R(λ) measurements allows to determine the direct band gap energy value in the order of 1.44 eV, indicating that CuInS2 compound has absorbing properties favorable for applications in solar cell devices. Photoluminescence measurements are performed on CuInS2 crystals and the analysis reveals that the emission is mainly due to donor-acceptor pair transitions.

Type
Research Article
Copyright
© EDP Sciences, 2013

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References

John, T.T., Mathew, M., Sudha Kartha, C., Vijayakumar, K.P., Abe, T., Kashiwaba, Y., Sol. Energy Mater. Sol. Cells 89, 27 (2005)
Hariskos, D., Ruckh, M., Rühle, U., Walter, T., Schock, H.W., Hedström, J., Stolt, L., Solar Energy Mater. Solar Cells 41–42, 345 (1996)CrossRef
Ryo, T., Nguyen, D.-C., Nakagiri, M., Toyoda, N., Matsuyoshi, H., Ito, S., Thin Solid Films 519, 7184 (2011)CrossRef
Cayzac, R., Boulc’h, F., Bendahan, M., Lauque, P., Knauth, P., Mat. Sci. Eng. B 157, 66 (2009)CrossRef
Yan, Y.-H., Liu, Y.-C., Fang, L., Zhu, J.-S., Zhao, H.-H., Li, D.-R., Lu, Z.-C., Zhou, S.-X., Trans. Nonferrous Met. Soc. China 18, 1083 (2008)CrossRef
Ben Rabeh, M., Zribi, M., Kanzari, M., Rezig, B., Mat. Lett. 59, 3164 (2005)CrossRef
Qiu, J., Jin, Z., Qian, J., Shi, Y., Wu, W., J. Cryst. Growth 282, 421 (2005)CrossRef
Allouche, N.K., Jebbari, N., Guasch, C., Turki, N.K., J. Alloys Compd. 501, 85 (2010)CrossRef
Peza-Tapia, J.M., Morales-Acevedo, A., Ortega-Lopez, M., Solar Energy Mater. Solar Cells 93, 544 (2009)CrossRef
Katerski, A., Danilson, M., Mere, A., Krunks, M., Energy Procedia 2, 103 (2010)CrossRef
Oja, I., Nanu, M., Katerski, A., Krunks, M., Mere, A., Raudoja, J., Goossens, A., Thin Solid Films 480–481, 82 (2005)CrossRef
Suriyanarayanan, N., Mahendran, C., Mat. Sci. Eng. B 176, 417 (2011)CrossRef
Kamoun, N., Jebbari, N., Belgacem, S., Bennaceur, R., Bonnet, J., Touhari, F., Lassabatere, L., J. Appl. Phys. 91, 1952 (2002)CrossRef
Majeed Khan, M.A., Kumar, S., Ahamed, M., AlSalhi, M.S., Mater. Lett. 68, 497 (2012)CrossRef
van der Pauw, L.J., Philips Res. Rep. 13, 1 (1958)
Guezmir, N., Ouerfelli, J., Belgacem, S., Mater. Chem. Phys. 96, 116 (2006)CrossRef
Bruggeman, D.A.G., Ann. Phys. (Leipzig) 24, 636 (1935)CrossRef
Belgacem, S., Bennaceur, R., Rev. Phys. Appl. 25, 1245 (1990)CrossRef
Makarova, T.L., Medvedkin, G.A., Rud, Yu.V., Tairov, M.A., Sov. Phys. Tech. Phys. 33, 8 (1988)
Henderson, D.O., Mu, R., Ueda, A., Wu, M.H., Gordon, E.M., Tung, Y.S., Huang, M., Keay, J., Feldman, L.C., Hollingsworth, J.A., Buhro, W.E., Harris, J.D., Hepp, A.F., Raffaelle, R.P., Mater. Eng. 22, 585 (2001)
Zouaghi, M.C., Ben Nasrallah, T., Marsillac, S., Bernède, J.C., Belgacem, S., Thin Solid Films 382, 39 (2001)CrossRef
Sun, L.Y., Kazmerski, L.L., Clark, A.H., Ireland, P.J., Morton, D.W., J. Vac. Sci. Technol. 15, 265 (1978)CrossRef
Nanu, M., Schoonman, J., Goossens, A., Thin Solid Films 451–452, 193 (2004)CrossRef
Mahendran, C., Suriyanarayanan, N., Physica B 405, 2009 (2010)CrossRef
Van Gheluwe, J., Versluys, J., Poelman, D., Verschraegen, J., Burgelman, M., Clauws, P., Thin Solid Films 511–512, 304 (2006)CrossRef
Onishi, T., Abe, K., Miyoshi, Y., Wakita, K., Sato, N., Mochizuki, K., J. Appl. Phys. Chem. Solids 66, 1947 (2005)CrossRef