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Effect of annealing and In content on the properties of electron beam evaporated ZnO films

Published online by Cambridge University Press:  18 August 2005

S. H. Mohamed ,
H. M. Ali ,
H. A. Mohamed  and
A. M. Salem
S. H. Mohamed*
Affiliation:
Physics Department, Faculty of Science, South Valley University, 82524 Sohag, Egypt
H. M. Ali
Affiliation:
Physics Department, Faculty of Science, South Valley University, 82524 Sohag, Egypt
H. A. Mohamed
Affiliation:
Physics Department, Faculty of Science, South Valley University, 82524 Sohag, Egypt
A. M. Salem
Affiliation:
Physics Division, Electron Microscopy and Thin Film Dept. National Research Center, Dokki, Cairo, Egypt
*
[email protected]
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Abstract

The effect of both annealing and In content on the properties of ZnO films prepared by electron beam evaporation were investigated. The evaporation was carried out at room temperature from bulk samples prepared by sintering technique. X-ray diffraction showed that the structure of ZnO-In2O3 films depends on both the In content and annealing temperature. Amorphous, highly transparent and relatively low resistive films which can be suitable for the usage as transparent electrode of organic light-emitting diode were obtained upon annealing at 300  $^{\circ}$ C. Partially crystalline, highly transparent and highly resistive films which can be used in piezoelectric applications were obtained upon annealing at 500  $^{\circ}$ C. For each composition the refractive index has no monotonic variation upon increasing annealing temperature.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 31 , Issue 2 , August 2005 , pp. 95 - 99
Copyright
© EDP Sciences, 2005

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