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Characterization of polycrystalline cBN compacts sintered without any additives

Published online by Cambridge University Press:  23 December 2010

N. Tan ,
C. J. Liu ,
Y. J. Li ,
Y. W. Dou ,
H. K. Wang ,
H. Ma ,
Z. L. Kou  and
D. W. He
N. Tan
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
C. J. Liu
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
Y. J. Li
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
Y. W. Dou
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
H. K. Wang
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
H. Ma
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
Z. L. Kou*
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
D. W. He
Affiliation:
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, 610065, P.R. China
*
[email protected]
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Abstract

Sintered cubic boron nitride (cBN) is widely used in various industrial applications because of its extreme wear and corrosion resistance, thermal and electrical properties. Conventional cBN sintered compacts contain binder materials and the binder materials remarkably affect their mechanical and thermal properties. In this work, polycrystalline cBN (PcBN) compacts were sintered on WC-16 wt.%Co substrates without any sintering agent at static high pressure of 5.0 GPa and temperatures of 1550–1750°C for 3–20 min. Chemical reactions between cBN and substances infiltrated from the substrates occurred during the high pressure and high temperature (HPHT) sintering process. Reaction products and their contents strongly depended on the sintering temperatures and heat treatment times according to the X-ray diffraction (XRD) observations. Scanning electron microscopy (SEM) analysis showed that some samples sintered under some specific conditions had plenty of cBN-to-cBN bonding among cBN grains and homogeneous microstructures. We also found that the formation of the cBN-to-cBN bonding in the samples had given rise to an improvement in cutting performance.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 53 , Issue 1 , January 2011 , 11501
Copyright
© EDP Sciences, 2010

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References

Braghini Jr, A.., R.T. Coelho, Int. J. Adv. Manuf. Technol. 17, 244 (2001) CrossRef
Ezugwu, E.O., Da Silva, R.B., Bonney, J., À.R. Machado, Int. J. Mach. Tool. Manuf. 45, 1009 (2005) CrossRef
More, A.S., Jiang, W., Brown, W.D., Malshe, A.P., J. Mater. Process. Technol. 180, 253 (2006) CrossRef
Neo, K.S., Rahman, M., Li, X.P., Khoo, H.H., Sawa, M., Maed, Y., J. Mater. Process. Technol. 140, 326 (2003) CrossRef
Sahin, Y., J. Mater. Process. Technol. 209, 3478 (2009) CrossRef
Wang, Z.G., Rahman, M., Wong, Y.S., Wear 258, 752 (2005) CrossRef
Sumiya, H., Uesaka, S., Satoh, S., J. Mater. Sci. 35, 1181 (2000) CrossRef
Benko, E., Klimczyk, P., Mackiewicz, S., Barr, T.L., Piskorska, E., Diam. Relat. Mater. 13, 521 (2004) CrossRef
Agarwala, B.K., Singh, B.P., Singhal, S.K., J. Mater. Sci. 21, 1765 (1986) CrossRef
Lv, R., Liu, J., Li, Y.J., Li, S.C., Kou, Z.L., He, D.W., Diam. Relat. Mater. 17, 2062 (2008) CrossRef
Angseryd, J., Elfwing, M., Olsson, E., Andrén, H.-O., Int. J. Refract. Met. Hard Mater. 27, 249 (2009) CrossRef
Benko, E., Diam. Relat. Mater. 6, 1192 (1997) CrossRef
Akaishi, M., Satoh, T., Ishii, M., Taniguchi, T., Yamaoka, S., J. Mater. Sci. Lett. 12, 1883 (1993) CrossRef
Dub, S.N., Petrusha, I.A., High Press. Res. 26, 71 (2006) CrossRef
Fukunaga, O., J. Phys.: Condens. Matter 14, 10979 (2002)
Taniguchi, T., Akaishi, M., Yamaoka, S., J. Mater. Res. 14, 162 (1999) CrossRef
Li, Y.J., Li, S.C., Lv, R., Qin, J.Q., Zhang, J., Wang, J.H., Wang, F.L., Kou, Z.L., He, D.W., J. Mater. Res. 23, 2366 (2008) CrossRef
Martínez, V., Echeberriaw, J., J. Am. Ceram. Soc. 90, 415 (2007) CrossRef
Fang, L.M., He, D.W., Chen, C., Ding, L.Y., Luo, X.J., High Press. Res. 27, 367 (2007) CrossRef
Wang, S.M., He, D.W., Wang, W.D., Lei, L., High Press. Res. 29, 806 (2009) CrossRef
Benko, E., Stanisław, J.S., Królicka, B., Wyczesany, A., Barr, T.L., Diam. Relat. Mater. 8, 1838 (1999) CrossRef
Rong, X., Tsurumi, T., Fukunaga, O., Yano, T., Diam. Relat. Mater. 11, 280 (2002) CrossRef