No CrossRef data available.
Published online by Cambridge University Press: 15 October 2000
This article presents a binary classification method which isused in defects detection. It's presented as recursives “boosting”algorithms which allow us to obtain a precise discriminating function bycombination of hypothesis and rules with moderate accuracy. This approachpermits the study of random phenomena governed by nonparametric laws and adirect decision for the observations classification and the determination offrontiers in an observation space. The various analyses which will bedeveloped are illustrated by simulations making it possible to evaluate thepossibilities of the method.