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Atomic force microscopy of twin formationin low-stacking fault CuAl alloy

Published online by Cambridge University Press:  15 April 1999

C. Coupeau ,
F. Tranchant ,
J. Vergnol  and
J. Grilhé
C. Coupeau*
Affiliation:
Laboratoire de Métallurgie-Physique, Université de Poitiers, B.P. 179, 86960 Futuroscope Cedex, France
F. Tranchant
Affiliation:
Laboratoire de Métallurgie-Physique, Université de Poitiers, B.P. 179, 86960 Futuroscope Cedex, France
J. Vergnol
Affiliation:
Laboratoire de Métallurgie-Physique, Université de Poitiers, B.P. 179, 86960 Futuroscope Cedex, France
J. Grilhé
Affiliation:
Laboratoire de Métallurgie-Physique, Université de Poitiers, B.P. 179, 86960 Futuroscope Cedex, France
*
[email protected]
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Abstract

CuAl single crystals of a low stacking fault energy have been deformed along the〈111〉 direction in an apparatus which consists of a compression machineinterfaced with an atomic force microscope. The emergence process of dislocations hasbeen in situ studied during deformation. Plasticity occurs in this material bypropagation of Shockley dislocations which generate two possible kinds of stackingfaults, extrinsic or intrinsic. The fine structure of slip lines has been investigatedby atomic force microscopy. A differentiation between these two possible twin mechanisms in this alloy is attempted. It is concluded that twinning in this materialcan not only be explained by the intrinsic stacking faults and that the contributionof extrinsic faults has to be considered.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 6 , Issue 1 , April 1999 , pp. 1 - 6
Copyright
© EDP Sciences, 1999

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References

Tranchant, F., Vergnol, J., Grilhé, J., Script. Met. Mat. 17, 175 (1983). CrossRef
F. Tranchant, Ph.D. thesis, University of Poitiers, France, 1987.
Vergnol, J., Grilhé, J., J. Phys. France 45, 1479 (1984). CrossRef
Tranchant, F., Vergnol, J., Denanot, M.F., Grilhé, J., Script. Met. 21, 269 (1987). CrossRef
Binnig, G., Rohrer, H., Gerber, C., Weibel, E., Phys. Rev. Lett. 50, 120 (1983). CrossRef
Binnig, G., Quate, C.F., Gerber, C., Phys. Rev. Lett. 56, 9 (1986). APS Link not valid for this citation CrossRef
Giessibl, F.J., Binnig, G., Ultramicroscopy 42-44, 7 (1992). CrossRef
Small, M.K., Coupeau, C., Grilhé, J., Script. Met. Mat. 32, 1573 (1995). CrossRef
C. Coupeau, J.C. Girard, J. Grilhé, J. Vacuum Sci. Tech. (in press, 1999).
C. Coupeau, J.C. Girard, J. Grilhé, Probe Microscopy (in press, 1999).
J. Vergnol, Ph.D. thesis, University of Poitiers, France, 1980.