Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-23T15:19:19.615Z Has data issue: false hasContentIssue false
  • English
  • Français

New Developments in CCD Technology for the UV-EUV Spectral Range

Published online by Cambridge University Press:  07 August 2017

Giovanni Bonanno
Giovanni Bonanno*
Affiliation:
Catania Astrophysical Observatory

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Lately, Charge Coupled Device (CCD) detectors have had great advances both in the visible and in the X-ray spectral range. However, the technology applied to these devices in the ultraviolet (UV) spectral region has not developed as well, because of some problems connected with the interaction between UV radiation and the materials typically used in semiconductor technology. In our laboratory the ultraviolet response of some UV-enhanced CCDs has been investigated. In particular, the quantum efficiency of coronene and lumigen coated and of back-illuminated ion implanted CCDs have been measured in the 304–11000 å spectral range. Very interesting results have been found, mainly for a one ion implanted CCD with quantum efficiency values of more than 60% at 304 å. Some measurements of the response uniformity of this spectral region have also been made. The results obtained encourage the possible use of these detectors in ultraviolet astronomy with very good performance.

Type
Section I — Review Papers
Information
Symposium - International Astronomical Union , Volume 167: New Developments in Array Technology and Applications , 1995 , pp. 39 - 48
Copyright
Copyright © Kluwer 1995 

References

Bailey, P., Castelli, C., Cross, M., van Essen, P., Holland, A., Jansen, F., de Korte, P., Lumb, D., Pool, P. and Verhoeve, P. 1990 Proc. SPIE 1344, 356.Google Scholar
Bonanno, G., Bruno, P., Consentino, R., Bortoletto, F., D'Alessandro, M., Fantinel, D., Balestra, A. and Marucci, P. 1995 in IAU Symposium No. 167, New Developments in Array Technology and Applications, Philip, A. G. D., Janes, K. A. and Upgren, A. R., eds. Kluwer Academic Pub., Dordrecht, p. 319.Google Scholar
Bonanno, G. and Di Benedetto, R. 1990 PASP 102, 835.CrossRefGoogle Scholar
Bonanno, G., Naletto, G., and Tondello, G. 1992 ESA Special Publication, 356, 233.Google Scholar
Brinkman, A. C., Aarts, H. J. M., Burt, D. and Pool, P. 1992 ESA Special Pub. 356, 75.Google Scholar
Janesick, J. R., Campbell, D., Elliot, T. and Daud, T. 1987 Opt. Eng. 26 (9), 852.Google Scholar
Bredthauer, R. A., Chandler, C. E., Janesick, J. R., McCurnin, T. W. and Sims, G. R. 1988 in Instrumentation for Ground-Based Optical Astronomy, Present and Future, Robinson, L. ed., Springer-Verlag, p. 486.Google Scholar
Janesick, J. R., Elliot, T., Daud, T., McCarthy, J. and Blouke, M. 1985 in Solid States Imaging Arrays, Prettyjohns, K. N., and Dereniak, E. L., Dereniak, E. L. eds., Proc. SPIE, 570, 46.Google Scholar
Janesick, J. R., Elliot, T., Dingizian, A., Bredthauer, R. A., Chandler, C. E., Westphal, J. A. and Gunn, J. E. 1990 Proc. SPIE 1242, 223.Google Scholar
Janesick, J., Elliot, T., Fraschetti, G., Collins, S., Blouke, M. and Corrie, B. 1989 Proc. SPIE 1071, 153.Google Scholar
McCarthy, K. J. and Wells, A. A. 1992 Proc. SPIE 1743, 211.Google Scholar
Naletto, G., Tondello, G., Villoresi, P., Bonanno, G., Cali, A., Di Benedetto, R. and Scuderi, S. 1992 Proc. SPIE, 1743, 199.CrossRefGoogle Scholar
Stern, R. A., Catura, R. C., Blouke, M. N. and Winzenread, M. 1986 Proc. SPIE 627, 583.Google Scholar
Verhoeve, P. W. A. M., den Boggende, A. J. F., Jansen, F. A., de Korte, P. A. J., Burt, D., Castelli, C. and Holland, A. D. 1991 in Astronomical Application, Conf. on Photoelectronic Image Devices 1991 — Section 1, p. 25.Google Scholar
Verhoeve, P. W. A. M., Jansen, F. A., de Korte, P. A. J., den Boggende, A. J. F., Bonanno, G., Cali, A., Di Benedetto, R. and Scuderi, S. 1992 Proc. SPIE 1743, 223.Google Scholar