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About the Photometric Calibration of IUE High Resolution Spectra: Quantification of the Order Overlap for the SWP Camera

Published online by Cambridge University Press:  04 August 2017

Luciana Bianchi  and
Ralph Bohlin
Luciana Bianchi
Affiliation:
Astronomical Observatory of Turin
Ralph Bohlin
Affiliation:
Space Telescope Science Institute

Abstract

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In order to quantify the errors in the IUE line profiles caused by the order overlap, we have compared line depths in IUE and Copernicus spectra. The excess line depth in IUE spectra suggests that the amount of order overlap is about 32% at 1150Å and decreases to zero at about 1400Å, for spectra extracted with the recent version of IUESISPS (the IUE standard extraction software). The transfer of a spectral feature from one order to the next is below the 5% level.

Based on these results, a correction technique is described.

Type
Research Article
Information
Symposium - International Astronomical Union , Volume 111: Calibration of Fundamental Stellar Quantities , 1985 , pp. 443 - 446
Copyright
Copyright © Reidel 1985 

References

Bianchi, L. 1980, in IUE Data Reduction, ed. Weiss, W. et al., (Vienna: Austrian Solar and Space Agency), p.161.Google Scholar
Bianchi, L. and Bohlin, R. 1984, Astron. Astrophys., in press.Google Scholar
Bohlin, R. and Tunrose, B. 1982, NASA IUE newsletter N.18, p.29 and ESA IUE newsletter N.13, p.14.Google Scholar
Thompson, R. and Bohlin, R. 1982, NASA IUE newsletter N.18, p.45.Google Scholar